Abstract: In an embodiment, a system, includes: a first pressurized load port interfaced with a workstation body; a second pressurized load port interfaced with the workstation body; the workstation body maintained at a set pressure level, wherein the workstation body comprises an internal material handling system configured to move a semiconductor workpiece within the workstation body between the first and second pressurized load ports at the set pressure level; a first modular tool interfaced with the first pressurized load port, wherein the first modular tool is configured to process the semiconductor workpiece; and a second modular tool interfaced with the second pressurized load port, wherein the second modular tool is configured to inspect the semiconductor workpiece processed by the first modular tool.

Abstract: Example methods are provided to improve placement of an adaptor (210,220) to a mobile computing device (100) to measure a test strip (221) coupled to the adaptor (220) with a camera (104) and a screen (108) on a face of the mobile computing device (100). The method may include displaying a light area on a first portion of the screen (108). The first portion may be adjacent to the camera (104). The light area and the camera (104) may be aligned with a key area of the test strip (221) so that the camera (104) is configured to capture an image of the key area. The method may further include providing first guiding information for a user to place the adaptor (210,220) to the mobile computing device (100) according to a position of the light area on the screen (108).

Abstract: A support platform is configured to support at least a portion of the weight of an associated semiconductor manufacturing tool, such as a furnace, when the associated semiconductor manufacturing tool is disposed on the support platform. The support platform comprises a base, a support plate disposed on the base and configured to move respective to the base, a brake plate arranged in fixed position respective to the base, and a damper secured to one of the support plate or the brake plate and frictionally engaging a track of the other of the support plate or the brake plate. The track includes a central track portion and inclined track portions extending away from the central track portion on respective first and opposite second sides of the central track portion. The inclined track portions are each inclined with respect to the central track portion.

Abstract: A support platform is configured to support at least a portion of the weight of an associated semiconductor manufacturing tool, such as a furnace, when the associated semiconductor manufacturing tool is disposed on the support platform. The support platform comprises a base, a support plate disposed on the base and configured to move respective to the base, a brake plate arranged in fixed position respective to the base, and a damper secured to one of the support plate or the brake plate and frictionally engaging a track of the other of the support plate or the brake plate. The track includes a central track portion and inclined track portions extending away from the central track portion on respective first and opposite second sides of the central track portion. The inclined track portions are each inclined with respect to the central track portion.

Abstract: An example non-transitory computer-readable medium storing machine-readable instructions that, when executed by a processor, cause the processor to: set a graphical processing unit (GPU) power allocation, the GPU power allocation indicating power available for use by a GPU. The processor sets a processor power allocation, the processor power allocation indicating power available for use by the processor. The processor receives a GPU usage value and modifies the GPU power allocation to a modified GPU power allocation based on the GPU usage value. The processor modifies the processor power allocation to a modified processor power allocation based on the modification of the GPU power allocation.

Abstract: A method of stabilizing performance of a processing device may include determining a maximum operational temperature of any number of cores of a processing device from a thermal control circuit of the processing device; setting a maximum power based on a maximum thermal capacity of the processing device to a power lower than the maximum operational temperature; increasing the power provided to the processing device when the maximum thermal capacity is below a set temperature; and placing the power provided to the processing device to an intermediate power level relative to the operational temperature and the maximum thermal capacity when operations of the processing device are to exceed the operational temperature of any of the cores of the processing device.

Abstract: An example non-transitory computer-readable medium storing machine-readable instructions that, when executed by a processor, cause the processor to: set a graphical processing unit (GPU) power allocation, the GPU power allocation indicating power available for use by a GPU. The processor sets a processor power allocation, the processor power allocation indicating power available for use by the processor. The processor receives a GPU usage value and modifies the GPU power allocation to a modified GPU power allocation based on the GPU usage value. The processor modifies the processor power allocation to a modified processor power allocation based on the modification of the GPU power allocation.