Patents by Inventor Chun-Lin Chiang

Chun-Lin Chiang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9842722
    Abstract: An electronic microscope includes a carrier, a first driving unit, a flow-buffer unit and an electron source. The carrier carries a sample. The first driving unit drives a first fluid to flow along a first flow path, wherein the first flow path passes through the sample. The flow-buffer unit is disposed on the first flow path to perform buffering on the first fluid, wherein the first fluid flows through the flow-buffer unit and the carrier in sequence. The electron source provides an electron beam to the sample.
    Type: Grant
    Filed: December 10, 2015
    Date of Patent: December 12, 2017
    Assignee: Industrial Technology Research Institute
    Inventors: Hsin-Hung Lee, Cheng-Yu Lee, Chun-Lin Chiang, Kun-Chih Tsai, Win-Ti Lin
  • Publication number: 20160172152
    Abstract: An electronic microscope includes a carrier, a first driving unit, a flow-buffer unit and an electron source. The carrier carries a sample. The first driving unit drives a first fluid to flow along a first flow path, wherein the first flow path passes through the sample. The flow-buffer unit is disposed on the first flow path to perform buffering on the first fluid, wherein the first fluid flows through the flow-buffer unit and the carrier in sequence. The electron source provides an electron beam to the sample.
    Type: Application
    Filed: December 10, 2015
    Publication date: June 16, 2016
    Inventors: Hsin-Hung Lee, Cheng-Yu Lee, Chun-Lin Chiang, Kun-Chih Tsai, Win-Ti Lin
  • Patent number: 8189183
    Abstract: An optical inspection apparatus capable of adjusting an incident angle of a detected light beam and adjusting a detecting angle for detecting the detected light beam. A driving mechanism is used to actuate two arms having a light source and a detector disposed thereon respectively to conduct a relative movement between the two arms so as to control the incident angle and the detecting angle. By means of the embodiments, mechanism for adjusting the angle is simplified so that the apparatus is capable of being adapted to combine with the application of micro sensors such that practicality of modularization design and microminiaturization and convenience of operation are capable of being greatly improved and that the cost can be reduced.
    Type: Grant
    Filed: October 16, 2009
    Date of Patent: May 29, 2012
    Assignee: Industrial Technology Research Institute
    Inventors: Hsueh-Ching Shih, Jia-Huey Tsao, Chih-Cheng Feng, Chun-Lin Chiang, Chun-Min Su, Kuo-Chi Chiu
  • Publication number: 20100253947
    Abstract: An optical inspection apparatus capable of adjusting an incident angle of a detected light beam and adjusting a detecting angle for detecting the detected light beam. A driving mechanism is used to actuate two arms having a light source and a detector disposed thereon respectively to conduct a relative movement between the two arms so as to control the incident angle and the detecting angle. By means of the embodiments, mechanism for adjusting the angle is simplified so that the apparatus is capable of being adapted to combine with the application of micro sensors such that practicality of modularization design and microminiaturization and convenience of operation are capable of being greatly improved and that the cost can be reduced.
    Type: Application
    Filed: October 16, 2009
    Publication date: October 7, 2010
    Applicant: Industrial Technology Research Institute
    Inventors: HSUEH-CHING SHIH, JIA-HUEY TSAO, CHIH-CHENG FENG, CHUN-LIN CHIANG, CHUN-MIN SU, KUO-CHI CHU