Abstract: A 3D-slanted roll crusher includes a housing, a number of driving devices mounted to the housing, a base mounted to an end of the housing away from the driving devices, a number of groups of grinders, a number of grinding teeth mounted on each of the grinders, and a number of material obstructing bodies mounted on an inner wall of the housing. The grinders correspond to the driving members one-to-one. Each grinder is connected to the base and the corresponding driving device. The grinders are spaced equally apart within the housing around a central axis of the housing and slantedly mounted on the base facing the driving devices.

Abstract: The invention discloses an exhalation measuring module, which may comprise a housing, a turbine and an electromagnetic converter. The housing may be formed with a receiving space connecting to an inlet and an outlet for passing an exhalation flow from the inlet to the outlet. The turbine may comprise a plurality of magnetic vanes, which are capable of rotation under the exhalation flow. The electromagnetic converter, positioned near the turbine, may generate electrical signals representing rotational motion of the magnetic vanes. The electrical signal may be outputted by the electromagnetic converter for estimating volume of an exhalation.

Abstract: A 3D-slanted roll crusher includes a housing, a number of driving devices mounted to the housing, a base mounted to an end of the housing away from the driving devices, a number of groups of grinders, a number of grinding teeth mounted on each of the grinders, and a number of material obstructing bodies mounted on an inner wall of the housing. The grinders correspond to the driving members one-to-one. Each grinder is connected to the base and the corresponding driving device. The grinders are spaced equally apart within the housing around a central axis of the housing and slantedly mounted on the base facing the driving devices.

Abstract: A cleaning device with electrostatic sheet auto rolling, comprising: a frame; a power gear set; a roller set, having a first roller, a second roller, a paper feeder roller; and a paper collector roller, arranged axially parallel with each other; and a drive shaft; wherein, the paper feeder roller is coaxially received inside a roller of paper; the first, the second and the paper collector rollers are driven to rotate by the power gear set; the paper collector roller is disposed radial to the paper feeder roller at a side thereof while enabling the first and the second rollers to be arranged therebetween; the drive shaft is enabled to move relative to the frame and perpendicular to the axial direction of the drive shaft; the drive shaft is arranged protruding out of the frame; and the drive shaft, the first and the second rollers are arranged parallel to each other.

Abstract: In a video switch method of viewing surveillance videos implemented by a server, a dividing mode, an arrangement mode, and a switch mode are acquired from a client device when a user of the client device is validated. The server controls at least one agent-computing device to divide display screens of each monitors connected to the at least one agent-computing device, into several sub-display areas according to the dividing mode. Individual surveillance videos of different monitored places from video record devices are displayed on the sub-display areas created, according to the arrangement mode. A predetermined next surveillance video replaces a current surveillance video displayed on a sub-display, either by manual switching or by means of an automatic cycle over a period of time.

Abstract: A method for controlling a cleaning device is presented, which includes the following steps. A cleaning device includes a control unit, a fan module, an optical emitter, and an optical sensor. The optical emitter and the optical sensor are located in an air inlet of the fan module. The control unit is preset with a first impedance value (Z1), a second impedance value (Z2), and a threshold, where 0<Z1<Z2. Then, the control unit reads an impedance value (Z) of the fan module. If Z1<Z<Z2, the control unit drives the fan module. If Z2<Z, the control unit reads a detected value of the optical sensor. If the detected value exceeds the threshold, the control unit drives the fan module, so as to increase a suction force of the fan module. If the detected value is smaller than the threshold, the control unit turns off the fan module.

Abstract: A cleaning device with electrostatic sheet auto rolling, comprising: a frame; a power gear set; a roller set, having a first roller, a second roller, a paper feeder roller; and a paper collector roller, arranged axially parallel with each other; and a drive shaft; wherein, the paper feeder roller is coaxially received inside a roller of paper; the first, the second and the paper collector rollers are driven to rotate by the power gear set; the paper collector roller is disposed radial to the paper feeder roller at a side thereof while enabling the first and the second rollers to be arranged therebetween; the drive shaft is enabled to move relative to the frame and perpendicular to the axial direction of the drive shaft; the drive shaft is arranged protruding out of the frame; and the drive shaft, the first and the second rollers are arranged parallel to each other.

Abstract: A method for controlling a cleaning device is presented, which includes the following steps. A cleaning device includes a control unit, a fan module, an optical emitter, and an optical sensor. The optical emitter and the optical sensor are located in an air inlet of the fan module. The control unit is preset with a first impedance value (Z1), a second impedance value (Z2), and a threshold, where 0<Z1<Z2. Then, the control unit reads an impedance value (Z) of the fan module. If Z1<Z<Z2, the control unit drives the fan module. If Z2<Z, the control unit reads a detected value of the optical sensor. If the detected value exceeds the threshold, the control unit drives the fan module, so as to increase a suction force of the fan module. If the detected value is smaller than the threshold, the control unit turns off the fan module.

Abstract: A method for detecting a defect of a chip includes: utilizing a plurality of scan patterns to scan a plurality of scan chains of the chip; for each of the scan patterns, obtaining a suspected defect set and an unsuspected defect set; obtaining an intersection of all suspected defect sets corresponding to the scan patterns; obtaining an union of all unsuspected defect sets corresponding to the scan patterns; subtracting the union from the intersection to obtain a resultant suspected defect set; and detecting the defect of the chip according to the resultant suspected defect set.

Abstract: The present invention is to provide a combo card reader, which includes a first inserting section and a second inserting section provided for receiving different types of storage units, a first reading unit and a second reading unit respectively and electrically connected with the first inserting section and the second inserting section through a switching unit, such that the reading units can transmit signals with the storage units in the corresponding inserting sections through driving the switching unit, enabling the first reading unit to read a corresponding storage unit in the first inserting section and the second reading unit to read a corresponding storage unit in the second inserting section and carrying out signal transmissions between the card reader and different kinds of storage units.

Abstract: An improved method of wafer height mapping using a wafer level sensor eliminates or substantially minimizes the “spacing” in the wafer height mapping data usually caused by having an exposure field on a wafer whose width is less than the width of the measurement spot array of the wafer level sensor and also not being a multiple of the width of a single measurement spot. According to the improved method, the measurement spot array is first translated towards one edge of the exposure field and scanned. Then the measurement spot array is translated towards the other edge of the exposure field and scanned second time to map the area that was missed during the first mapping scan.

Abstract: An improved method of wafer height mapping using a wafer level sensor eliminates or substantially minimizes the “spacing” in the wafer height mapping data usually caused by having an exposure field on a wafer whose width is less than the width of the measurement spot array of the wafer level sensor and also not being a multiple of the width of a single measurement spot. According to the improved method, the measurement spot array is first translated towards one edge of the exposure field and scanned. Then the measurement spot array is translated towards the other edge of the exposure field and scanned second time to map the area that was missed during the first mapping scan.

Abstract: An improved photo resist coating and developing system comprising a track unit and a scanner unit is disclosed. The track unit has a coating unit for coating photo resist on a wafer. The scanner unit includes an enhanced wafer pre-alignment module, an expose stage, and a develop module. The enhanced wafer pre-alignment module is capable of performing wafer edge exposure (WEE) which conventionally required a separate WEE module as part of the track unit. By incorporating the WEE function into the wafer pre-alignment module of the scanner unit, the WEE module of the track unit is no longer required and duplication of wafer alignment and centering performed by the WEE module is eliminated.

Abstract: The present invention provides an electric card fastener with elastic metal cantilever, configured to a circuit board, for fastening an electric card. The electric card fastener is formed by a corresponding mounted base. The mounted base includes a cantilever with a restricted portion disposed along and a mounted portion on the button, connecting with one end of the cantilever. After the connection of the cantilever and the mounted portion, the cantilever is elastic for backward and forward movement. Whereby, the electric card fastener fastens the electric card in a predetermined position for preventing poor electrical connection and strengthening the construction of components of the present invention for improving support ability, and the fastening components are used as a short cut for the grounding circuit on the electric card to connect ground.

Abstract: The present invention provides an electric card fixture for fastening the electric card. The electric card fixture comprises a base having an opening and a pivot member, pivotally connecting to one end of the base. By the base on the circuit board, the electric card is restricted by the opening of the base to a predetermined position. Therefore, the electric card is positioned. The pivot member presses the electric card, so that the electric card will not flip upward. Accordingly, the electric card fixture locks up the electric card, so that the electric card will not fall off when shaken and therefore provides prefect electrical connection.

Abstract: The present invention provides an electric card fastener with elastic metal cantilever, configured to a circuit board, for fastening an electric card. The electric card fastener is formed by a corresponding mounted base. The mounted base includes a cantilever with a restricted portion disposed along and a mounted portion on the button, connecting with one end of the cantilever. After the connection of the cantilever and the mounted portion, the cantilever is elastic for backward and forward movement. Whereby, the electric card fastener fastens the electric card in a predetermined position for preventing poor electrical connection and strengthening the construction of components of the present invention for improving support ability, and the fastening components are used as a short cut for the grounding circuit on the electric card to connect ground.

Abstract: A system for monitoring semiconductor testing tools comprises a tester testing a semiconductor device, whereby a test result is derived, a storage device storing a logic function corresponding to the semiconductor device, and a processor receiving the test result and the logic function from the tester and storage device respectively, and applying the logic function to the test result for validation.

Abstract: Within both an electrical test apparatus for electrically testing a substrate, and a method for electrically testing the substrate while employing the electrical test apparatus, there is provided for an automatic selection of an electrical test program, absent operator intervention, once having identified a substrate. Due to the absence of operator intervention, the substrate is more accurately electrically tested.

Abstract: A system for monitoring semiconductor testing tools comprises a tester testing a semiconductor device, whereby a test result is derived, a storage device storing a logic function corresponding to the semiconductor device, and a processor receiving the test result and the logic function from the tester and storage device respectively, and applying the logic function to the test result for validation.