Patents by Inventor CHUN-WEN LIANG

CHUN-WEN LIANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11555996
    Abstract: A method for analyzing 2D material thin film and a system for analyzing 2D material thin film are disclosed. The detection method includes the following steps: capturing sample images of 2D material thin films; measuring the 2D material thin films by a Raman spectrometer; performing a visible light hyperspectral algorithm on the sample images by a processor to generate a plurality of visible light hyperspectral images; performing a training and validation procedure, performing an image feature algorithm on the visible light hyperspectral images, and establishing a thin film prediction model based on a validation; and capturing a thin-film image to be measured by the optical microscope, performing the visible light hyperspectral algorithm, and then generating a distribution result of the thin-film image to be measured according to an analysis of the thin film prediction model.
    Type: Grant
    Filed: April 20, 2021
    Date of Patent: January 17, 2023
    Assignee: NATIONAL CHUNG CHENG UNIVERSITY
    Inventors: Hsiang-Chen Wang, Kai-Chun Li, Kai-Hsiang Ke, Chun-Wen Liang
  • Publication number: 20210349299
    Abstract: A method for analyzing 2D material thin film and a system for analyzing 2D material thin film are disclosed. The detection method includes the following steps: capturing sample images of 2D material thin films; measuring the 2D material thin films by a Raman spectrometer; performing a visible light hyperspectral algorithm on the sample images by a processor to generate a plurality of visible light hyperspectral images; performing a training and validation procedure, performing an image feature algorithm on the visible light hyperspectral images, and establishing a thin film prediction model based on a validation; and capturing a thin-film image to be measured by the optical microscope, performing the visible light hyperspectral algorithm, and then generating a distribution result of the thin-film image to be measured according to an analysis of the thin film prediction model.
    Type: Application
    Filed: April 20, 2021
    Publication date: November 11, 2021
    Inventors: HSIANG-CHEN WANG, KAI-CHUN LI, KAI-HSIANG KE, CHUN-WEN LIANG