Patents by Inventor Chun-Yun Tsai

Chun-Yun Tsai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Alignment mark structure with dummy pattern
    Patent number: 10192832
    Abstract: An alignment mark structure including a substrate, an alignment mark and at least one dummy pattern is provided. The alignment mark is disposed on the substrate. The at least one dummy pattern is disposed on the substrate and located adjacent to the alignment mark, wherein a size of the at least one dummy pattern is smaller than a size of the alignment mark.
    Type: Grant
    Filed: August 16, 2016
    Date of Patent: January 29, 2019
    Assignee: United Microelectronics Corp.
    Inventors: Kai-Jen Hsiao, Chun-Yun Tsai, Cheng-Yi Hsu
  • ALIGNMENT MARK STRUCTURE WITH DUMMY PATTERN
    Publication number: 20180053729
    Abstract: An alignment mark structure including a substrate, an alignment mark and at least one dummy pattern is provided. The alignment mark is disposed on the substrate. The at least one dummy pattern is disposed on the substrate and located adjacent to the alignment mark, wherein a size of the at least one dummy pattern is smaller than a size of the alignment mark.
    Type: Application
    Filed: August 16, 2016
    Publication date: February 22, 2018
    Applicant: United Microelectronics Corp.
    Inventors: Kai-Jen Hsiao, Chun-Yun Tsai, Cheng-Yi Hsu