Patents by Inventor Chung-Chu Chang
Chung-Chu Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8237933Abstract: The present invention relates to a method for image calibration and an apparatus for image acquiring. In the method for image calibration, the image formation position for an image acquiring unit of the apparatus is calibrated according to the relative location of the image acquiring unit to a objective lens of the apparatus, wherein the relative location is determined by calculating the focus index of the image acquired by the image acquiring unit so that a clear and sharp interferogram can be obtained for three dimensional surface profile measuring. In addition, it is possible to obtain a clear and sharp image without any interference fringe outside the coherent range by adjusting the image formation position, which is capable of being utilized for two dimensional defect detection and dimension measurement.Type: GrantFiled: July 6, 2011Date of Patent: August 7, 2012Assignee: Industrial Technology Research InstituteInventors: Jin-Liang Chen, Shih-Hsuan Kuo, Chung-Chu Chang
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Publication number: 20110261362Abstract: The present invention relates to a method for image calibration and an apparatus for image acquiring. In the method for image calibration, the image formation position for an image acquiring unit of the apparatus is calibrated according to the relative location of the image acquiring unit to a objective lens of the apparatus, wherein the relative location is determined by calculating the focus index of the image acquired by the image acquiring unit so that a clear and sharp interferogram can be obtained for three dimensional surface profile measuring. In addition, it is possible to obtain a clear and sharp image without any interference fringe outside the coherent range by adjusting the image formation position, which is capable of being utilized for two dimensional defect detection and dimension measurement.Type: ApplicationFiled: July 6, 2011Publication date: October 27, 2011Applicant: Industrial Technology Research InstituteInventors: Jin-Liang Chen, Shih-Hsuan Kuo, Chung-Chu Chang
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Patent number: 8035820Abstract: A method for out-of-plane displacement detection is disclosed. The out-of-plane displacement is detected by analyzing all the fringe density indexes calculated using the frequency-domain information extracted from a series of interference images of the sample vibrating at different frequencies. The present invention further discloses a method and an apparatus for resonant frequency identification by detecting the peak value of all the fringe indexes calculated at different scanning frequencies. With the identified resonant frequency, the full-field vibratory surface profile of the sample in various resonance modes can be reconstructed.Type: GrantFiled: July 15, 2010Date of Patent: October 11, 2011Assignee: Industrial Technology Research InsituteInventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
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Patent number: 8005290Abstract: The present invention relates to a method for image calibration and an apparatus for image acquiring. In the method for image calibration, the image formation position for an image acquiring unit of the apparatus is calibrated according to the relative location of the image acquiring unit to a objective lens of the apparatus, wherein the relative location is determined by calculating the focus index of the image acquired by the image acquiring unit so that a clear and sharp interferogram can be obtained for three dimensional surface profile measuring. In addition, it is possible to obtain a clear and sharp image without any interference fringe outside the coherent range by adjusting the image formation position, which is capable of being utilized for two dimensional defect detection and dimension measurement.Type: GrantFiled: March 31, 2008Date of Patent: August 23, 2011Assignee: Industrial Technology Research InstituteInventors: Jin-Liang Chen, Shih-Hsuan Kuo, Chung-Chu Chang
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Patent number: 7965394Abstract: A method and apparatus for identifying dynamic characteristics of a vibratory object is provided in the present invention, in which a series of dynamic interference images of the vibratory object is acquired through a frequency sweeping procedure and a two-dimensional image scanning procedure. Thereafter, the acquired images are processed for obtaining the corresponding differential fringe density index by signal processing technique of band-pass filtering method so as to further identify the dynamic characteristics of the vibratory object.Type: GrantFiled: July 1, 2008Date of Patent: June 21, 2011Assignees: Industrial Technology Research Institute, National Taipei University of TechnologyInventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
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Patent number: 7929044Abstract: An autofocus searching method includes the following procedures. First, focus values of images, which are acquired during the movement of the object lens, are calculated, in which the focus value includes at least the intensity value of the image derived from the intensities of the pixels of the image. Next, focus searching is based on a first focus-searching step constant and a first focus-searching direction, in which the first focus-searching step constant is a function, e.g., the multiplication, of the focus value and a focus-searching step size. If the focus searching position moves across a peak of the focus values, it is then amended to be based on a second focus-searching direction and a second focus-searching step constant, in which the second focus-searching step constant is smaller than the first focus-searching step constant, and the second focus-searching direction is opposite to the first focus-searching direction.Type: GrantFiled: December 12, 2007Date of Patent: April 19, 2011Assignee: Industrial Technology Research InstituteInventors: Jin-Liang Chen, Chung Chu Chang, Chi Hong Tung
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Publication number: 20100277744Abstract: A method for out-of-plane displacement detection is disclosed. The out-of-plane displacement is detected by analyzing all the fringe density indexes calculated using the frequency-domain information extracted from a series of interference images of the sample vibrating at different frequencies. The present invention further discloses a method and an apparatus for resonant frequency identification by detecting the peak value of all the fringe indexes calculated at different scanning frequencies. With the identified resonant frequency, the full-field vibratory surface profile of the sample in various resonance modes can be reconstructed.Type: ApplicationFiled: July 15, 2010Publication date: November 4, 2010Inventors: Liang-Chia CHEN, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
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Patent number: 7782466Abstract: A method for out-of-plane displacement detection is disclosed. The out-of-plane displacement is detected by analyzing all the fringe density indexes calculated using the frequency-domain information extracted from a series of interference images of the sample vibrating at different frequencies. The present invention further discloses a method and an apparatus for resonant frequency identification by detecting the peak value of all the fringe indexes calculated at different scanning frequencies. With the identified resonant frequency, the full-field vibratory surface profile of the sample in various resonance modes can be reconstructed.Type: GrantFiled: November 28, 2007Date of Patent: August 24, 2010Assignee: Industrial Technology Research InsituteInventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
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Patent number: 7610170Abstract: A method for improving the measurement capability of multi-parameter inspection systems includes performing a measuring procedure to acquire a measured signature of a sample, calculating weighting factors representing a correlation between structural parameters of the sample by using a weighting algorithm, transforming the weighting factors into a sampling function by using a transforming rule, updating the measured signature to form an updated measured signature and generating a plurality of updated nominal signatures according to the sampling function, and comparing the updated measured signature and the updated nominal signatures to determine the structural parameters of the sample.Type: GrantFiled: September 20, 2007Date of Patent: October 27, 2009Assignee: Industrial Technology Research InstituteInventors: Chun Hung Ko, Yi Sha Kuo, Chung Chu Chang
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Publication number: 20090180124Abstract: A method and apparatus for identifying dynamic characteristics of a vibratory object is provided in the present invention, in which a series of dynamic interference images of the vibratory object is acquired through a frequency sweeping procedure and a two-dimensional image scanning procedure. Thereafter, the acquired images are processed for obtaining the corresponding differential fringe density index by signal processing technique of band-pass filtering method so as to further identify the dynamic characteristics of the vibratory object.Type: ApplicationFiled: July 1, 2008Publication date: July 16, 2009Applicants: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGYInventors: LIANG-CHIA CHEN, CHUNG-CHU CHANG, YAO-TING HUANG, JIN-LIANG CHEN
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Patent number: 7536265Abstract: The present invention relates to a signal analysis method for vibratory interferometry to identify the vibratory characteristics of an object under test. A vibratory stroboscopic interferometric signal of an object under vibration is obtained. The vibratory stroboscopic interferometric signal is analyzed with a deconvolution operation to obtain a reformed vibratory stroboscopic interferometric signal.Type: GrantFiled: September 28, 2007Date of Patent: May 19, 2009Assignees: Industrial Technology Research Institute, National Taipei University of TechnologyInventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
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Publication number: 20090030631Abstract: A method for improving the measurement capability of multi-parameter inspection systems includes performing a measuring procedure to acquire a measured signature of a sample, calculating weighting factors representing a correlation between structural parameters of the sample by using a weighting algorithm, transforming the weighting factors into a sampling function by using a transforming rule, updating the measured signature to form an updated measured signature and generating a plurality of updated nominal signatures according to the sampling function, and comparing the updated measured signature and the updated nominal signatures to determine the structural parameters of the sample.Type: ApplicationFiled: September 20, 2007Publication date: January 29, 2009Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Chun Hung Ko, Yi Sha Ku, Chung Chu Chang
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Publication number: 20090010560Abstract: The present invention relates to a method for image calibration and an apparatus for image acquiring. In the method for image calibration, the image formation position for an image acquiring unit of the apparatus is calibrated according to the relative location of the image acquiring unit to a objective lens of the apparatus, wherein the relative location is determined by calculating the focus index of the image acquired by the image acquiring unit so that a clear and sharp interferogram can be obtained for three dimensional surface profile measuring. In addition, it is possible to obtain a clear and sharp image without any interference fringe outside the coherent range by adjusting the image formation position, which is capable of being utilized for two dimensional defect detection and dimension measurement.Type: ApplicationFiled: March 31, 2008Publication date: January 8, 2009Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Jin-Liang Chen, Shih-Hsuan Kuo, Chung-Chu Chang
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Publication number: 20080243441Abstract: A signal analysis method for vibratory interferometry is disclosed in the present invention for measuring the vibratory characteristics of an object under test. The signal analysis method comprises steps of: obtaining a vibratory interferometric signal of an object under vibration; and analyzing the vibratory interferometric signal with a deconvolution operation to obtain a reformed vibratory interferometric signal.Type: ApplicationFiled: September 28, 2007Publication date: October 2, 2008Applicants: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGYInventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
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Publication number: 20080151097Abstract: An autofocus searching method includes the following procedures. First, focus values of images, which are acquired during the movement of the object lens, are calculated, in which the focus value includes at least the intensity value of the image derived from the intensities of the pixels of the image. Next, focus searching is based on a first focus-searching step constant and a first focus-searching direction, in which the first focus-searching step constant is a function, e.g., the multiplication, of the focus value and a focus-searching step. If the focus searching position moves across a peak of the focus values, it is then amended to be based on a second focus-searching direction and a second focus-searching step constant, in which the second focus-searching step constant is smaller than the first focus-searching step constant, and the second focus-searching direction is opposite to the first focus-searching direction.Type: ApplicationFiled: December 12, 2007Publication date: June 26, 2008Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Jin-Liang Chen, Chung Chu Chang, Chi Hong Tung
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Publication number: 20080137095Abstract: A method for out-of-plane displacement detection is disclosed. The out-of-plane displacement is detected by analyzing all the fringe density indexes calculated using the frequency-domain information extracted from a series of interference images of the sample vibrating at different frequencies. The present invention further discloses a method and an apparatus for resonant frequency identification by detecting the peak value of all the fringe indexes calculated at different scanning frequencies. With the identified resonant frequency, the full-field vibratory surface profile of the sample in various resonance modes can be reconstructed.Type: ApplicationFiled: November 28, 2007Publication date: June 12, 2008Inventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
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Patent number: 7187451Abstract: An apparatus for measuring a two-dimensional displacement is disclosed and includes a laser light source, a collimator lens, a beam splitter, a plurality of staggered conjugate optic lens and a plurality of interference optical dephasing modules. The laser light source provides a laser light incident on the collimator lens to generate collimated laser beams. Each of the collimated laser beams are incident on the beam splitter to be separated into two incident beams and incident on a two-dimensional diffraction unit to generate a plurality of first diffracted beams and a plurality of second-order diffracted beams. The staggered conjugate optic lens are used to reflect the first diffracted beams so that the first diffracted beams return to the two-dimensional diffraction unit to generate a plurality of second diffracted beams where the second diffracted beams and the second-order diffracted beams generated as a result of the first diffraction of the beams stagger.Type: GrantFiled: September 8, 2004Date of Patent: March 6, 2007Assignee: Industrial Technology Reserach InstituteInventors: Ching-Fen Kao, Chung-Chu Chang, Ching-Fang Lin
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Publication number: 20050062981Abstract: An apparatus for measuring a two-dimensional displacement is disclosed and includes a laser light source, a collimator lens, a beam splitter, a plurality of staggered conjugate optic lens and a plurality of interference optical dephasing modules. The laser light source provides a laser light incident on the collimator lens to generate collimated laser beams. Each of the collimated laser beams are incident on the beam splitter to be separated into two incident beams and incident on a two-dimensional diffraction unit to generate a plurality of first diffracted beams and a plurality of second-order diffracted beams. The staggered conjugate optic lens are used to reflect the first diffracted beams so that the first diffracted beams return to the two-dimensional diffraction unit to generate a plurality of second diffracted beams where the second diffracted beams and the second-order diffracted beams generated as a result of the first diffraction of the beams stagger.Type: ApplicationFiled: September 8, 2004Publication date: March 24, 2005Applicant: Industrial Technology Research InstituteInventors: Ching-Fen Kao, Chung-Chu Chang, Ching-Fang Lin
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Patent number: 6744520Abstract: A method for measuring two-dimensional displacement using conjugate optics comprises the steps of emitting an incident beam onto a diffraction element to generate many firstly diffracted beams, selecting two axially symmetric beams of the same order of diffraction from the firstly diffracted beams, introducing corresponding sets of wavefront reconstruction optics to reflect the two selected beams back onto the same incident spot along the same optical paths and to generate many secondly diffracted beams, selecting two axially symmetric pairs of beams of the same order of diffraction from the secondly diffracted beams, forming two interference fringes by superposing the two selected pairs of beams via corresponding mirrors and interferometric optics, and obtaining two linearly independent displacements of the diffraction element relative to the rest of the optics by decoding the two interference fringes.Type: GrantFiled: March 4, 2002Date of Patent: June 1, 2004Assignee: Industrial Technology Research InstituteInventors: Chung-Chu Chang, Ching-Fen Kao, Chih-Kung Lee
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Publication number: 20030164950Abstract: A method for measuring two-dimensional displacement using conjugate optics comprises the steps of emitting an incident beam onto a diffraction element to generate many firstly diffracted beams, selecting two axially symmetric beams of the same order of diffraction from the firstly diffracted beams, introducing corresponding sets of wavefront reconstruction optics to reflect the two selected beams back onto the same incident spot along the same optical paths and to generate many secondly diffracted beams, selecting two axially symmetric pairs of beams of the same order of diffraction from the secondly diffracted beams, forming two interference fringes by superposing the two selected pairs of beams via corresponding mirrors and interferometric optics, and obtaining two linearly independent displacements of the diffraction element relative to the rest of the optics by decoding the two interference fringes.Type: ApplicationFiled: March 4, 2002Publication date: September 4, 2003Inventors: Chung-Chu Chang, Ching-Fen Kao, Chih-Kung Lee