Patents by Inventor Chung-Chu Chang

Chung-Chu Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8237933
    Abstract: The present invention relates to a method for image calibration and an apparatus for image acquiring. In the method for image calibration, the image formation position for an image acquiring unit of the apparatus is calibrated according to the relative location of the image acquiring unit to a objective lens of the apparatus, wherein the relative location is determined by calculating the focus index of the image acquired by the image acquiring unit so that a clear and sharp interferogram can be obtained for three dimensional surface profile measuring. In addition, it is possible to obtain a clear and sharp image without any interference fringe outside the coherent range by adjusting the image formation position, which is capable of being utilized for two dimensional defect detection and dimension measurement.
    Type: Grant
    Filed: July 6, 2011
    Date of Patent: August 7, 2012
    Assignee: Industrial Technology Research Institute
    Inventors: Jin-Liang Chen, Shih-Hsuan Kuo, Chung-Chu Chang
  • Publication number: 20110261362
    Abstract: The present invention relates to a method for image calibration and an apparatus for image acquiring. In the method for image calibration, the image formation position for an image acquiring unit of the apparatus is calibrated according to the relative location of the image acquiring unit to a objective lens of the apparatus, wherein the relative location is determined by calculating the focus index of the image acquired by the image acquiring unit so that a clear and sharp interferogram can be obtained for three dimensional surface profile measuring. In addition, it is possible to obtain a clear and sharp image without any interference fringe outside the coherent range by adjusting the image formation position, which is capable of being utilized for two dimensional defect detection and dimension measurement.
    Type: Application
    Filed: July 6, 2011
    Publication date: October 27, 2011
    Applicant: Industrial Technology Research Institute
    Inventors: Jin-Liang Chen, Shih-Hsuan Kuo, Chung-Chu Chang
  • Patent number: 8035820
    Abstract: A method for out-of-plane displacement detection is disclosed. The out-of-plane displacement is detected by analyzing all the fringe density indexes calculated using the frequency-domain information extracted from a series of interference images of the sample vibrating at different frequencies. The present invention further discloses a method and an apparatus for resonant frequency identification by detecting the peak value of all the fringe indexes calculated at different scanning frequencies. With the identified resonant frequency, the full-field vibratory surface profile of the sample in various resonance modes can be reconstructed.
    Type: Grant
    Filed: July 15, 2010
    Date of Patent: October 11, 2011
    Assignee: Industrial Technology Research Insitute
    Inventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
  • Patent number: 8005290
    Abstract: The present invention relates to a method for image calibration and an apparatus for image acquiring. In the method for image calibration, the image formation position for an image acquiring unit of the apparatus is calibrated according to the relative location of the image acquiring unit to a objective lens of the apparatus, wherein the relative location is determined by calculating the focus index of the image acquired by the image acquiring unit so that a clear and sharp interferogram can be obtained for three dimensional surface profile measuring. In addition, it is possible to obtain a clear and sharp image without any interference fringe outside the coherent range by adjusting the image formation position, which is capable of being utilized for two dimensional defect detection and dimension measurement.
    Type: Grant
    Filed: March 31, 2008
    Date of Patent: August 23, 2011
    Assignee: Industrial Technology Research Institute
    Inventors: Jin-Liang Chen, Shih-Hsuan Kuo, Chung-Chu Chang
  • Patent number: 7965394
    Abstract: A method and apparatus for identifying dynamic characteristics of a vibratory object is provided in the present invention, in which a series of dynamic interference images of the vibratory object is acquired through a frequency sweeping procedure and a two-dimensional image scanning procedure. Thereafter, the acquired images are processed for obtaining the corresponding differential fringe density index by signal processing technique of band-pass filtering method so as to further identify the dynamic characteristics of the vibratory object.
    Type: Grant
    Filed: July 1, 2008
    Date of Patent: June 21, 2011
    Assignees: Industrial Technology Research Institute, National Taipei University of Technology
    Inventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
  • Patent number: 7929044
    Abstract: An autofocus searching method includes the following procedures. First, focus values of images, which are acquired during the movement of the object lens, are calculated, in which the focus value includes at least the intensity value of the image derived from the intensities of the pixels of the image. Next, focus searching is based on a first focus-searching step constant and a first focus-searching direction, in which the first focus-searching step constant is a function, e.g., the multiplication, of the focus value and a focus-searching step size. If the focus searching position moves across a peak of the focus values, it is then amended to be based on a second focus-searching direction and a second focus-searching step constant, in which the second focus-searching step constant is smaller than the first focus-searching step constant, and the second focus-searching direction is opposite to the first focus-searching direction.
    Type: Grant
    Filed: December 12, 2007
    Date of Patent: April 19, 2011
    Assignee: Industrial Technology Research Institute
    Inventors: Jin-Liang Chen, Chung Chu Chang, Chi Hong Tung
  • Publication number: 20100277744
    Abstract: A method for out-of-plane displacement detection is disclosed. The out-of-plane displacement is detected by analyzing all the fringe density indexes calculated using the frequency-domain information extracted from a series of interference images of the sample vibrating at different frequencies. The present invention further discloses a method and an apparatus for resonant frequency identification by detecting the peak value of all the fringe indexes calculated at different scanning frequencies. With the identified resonant frequency, the full-field vibratory surface profile of the sample in various resonance modes can be reconstructed.
    Type: Application
    Filed: July 15, 2010
    Publication date: November 4, 2010
    Inventors: Liang-Chia CHEN, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
  • Patent number: 7782466
    Abstract: A method for out-of-plane displacement detection is disclosed. The out-of-plane displacement is detected by analyzing all the fringe density indexes calculated using the frequency-domain information extracted from a series of interference images of the sample vibrating at different frequencies. The present invention further discloses a method and an apparatus for resonant frequency identification by detecting the peak value of all the fringe indexes calculated at different scanning frequencies. With the identified resonant frequency, the full-field vibratory surface profile of the sample in various resonance modes can be reconstructed.
    Type: Grant
    Filed: November 28, 2007
    Date of Patent: August 24, 2010
    Assignee: Industrial Technology Research Insitute
    Inventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
  • Patent number: 7610170
    Abstract: A method for improving the measurement capability of multi-parameter inspection systems includes performing a measuring procedure to acquire a measured signature of a sample, calculating weighting factors representing a correlation between structural parameters of the sample by using a weighting algorithm, transforming the weighting factors into a sampling function by using a transforming rule, updating the measured signature to form an updated measured signature and generating a plurality of updated nominal signatures according to the sampling function, and comparing the updated measured signature and the updated nominal signatures to determine the structural parameters of the sample.
    Type: Grant
    Filed: September 20, 2007
    Date of Patent: October 27, 2009
    Assignee: Industrial Technology Research Institute
    Inventors: Chun Hung Ko, Yi Sha Kuo, Chung Chu Chang
  • Publication number: 20090180124
    Abstract: A method and apparatus for identifying dynamic characteristics of a vibratory object is provided in the present invention, in which a series of dynamic interference images of the vibratory object is acquired through a frequency sweeping procedure and a two-dimensional image scanning procedure. Thereafter, the acquired images are processed for obtaining the corresponding differential fringe density index by signal processing technique of band-pass filtering method so as to further identify the dynamic characteristics of the vibratory object.
    Type: Application
    Filed: July 1, 2008
    Publication date: July 16, 2009
    Applicants: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY
    Inventors: LIANG-CHIA CHEN, CHUNG-CHU CHANG, YAO-TING HUANG, JIN-LIANG CHEN
  • Patent number: 7536265
    Abstract: The present invention relates to a signal analysis method for vibratory interferometry to identify the vibratory characteristics of an object under test. A vibratory stroboscopic interferometric signal of an object under vibration is obtained. The vibratory stroboscopic interferometric signal is analyzed with a deconvolution operation to obtain a reformed vibratory stroboscopic interferometric signal.
    Type: Grant
    Filed: September 28, 2007
    Date of Patent: May 19, 2009
    Assignees: Industrial Technology Research Institute, National Taipei University of Technology
    Inventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
  • Publication number: 20090030631
    Abstract: A method for improving the measurement capability of multi-parameter inspection systems includes performing a measuring procedure to acquire a measured signature of a sample, calculating weighting factors representing a correlation between structural parameters of the sample by using a weighting algorithm, transforming the weighting factors into a sampling function by using a transforming rule, updating the measured signature to form an updated measured signature and generating a plurality of updated nominal signatures according to the sampling function, and comparing the updated measured signature and the updated nominal signatures to determine the structural parameters of the sample.
    Type: Application
    Filed: September 20, 2007
    Publication date: January 29, 2009
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Chun Hung Ko, Yi Sha Ku, Chung Chu Chang
  • Publication number: 20090010560
    Abstract: The present invention relates to a method for image calibration and an apparatus for image acquiring. In the method for image calibration, the image formation position for an image acquiring unit of the apparatus is calibrated according to the relative location of the image acquiring unit to a objective lens of the apparatus, wherein the relative location is determined by calculating the focus index of the image acquired by the image acquiring unit so that a clear and sharp interferogram can be obtained for three dimensional surface profile measuring. In addition, it is possible to obtain a clear and sharp image without any interference fringe outside the coherent range by adjusting the image formation position, which is capable of being utilized for two dimensional defect detection and dimension measurement.
    Type: Application
    Filed: March 31, 2008
    Publication date: January 8, 2009
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Jin-Liang Chen, Shih-Hsuan Kuo, Chung-Chu Chang
  • Publication number: 20080243441
    Abstract: A signal analysis method for vibratory interferometry is disclosed in the present invention for measuring the vibratory characteristics of an object under test. The signal analysis method comprises steps of: obtaining a vibratory interferometric signal of an object under vibration; and analyzing the vibratory interferometric signal with a deconvolution operation to obtain a reformed vibratory interferometric signal.
    Type: Application
    Filed: September 28, 2007
    Publication date: October 2, 2008
    Applicants: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY
    Inventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
  • Publication number: 20080151097
    Abstract: An autofocus searching method includes the following procedures. First, focus values of images, which are acquired during the movement of the object lens, are calculated, in which the focus value includes at least the intensity value of the image derived from the intensities of the pixels of the image. Next, focus searching is based on a first focus-searching step constant and a first focus-searching direction, in which the first focus-searching step constant is a function, e.g., the multiplication, of the focus value and a focus-searching step. If the focus searching position moves across a peak of the focus values, it is then amended to be based on a second focus-searching direction and a second focus-searching step constant, in which the second focus-searching step constant is smaller than the first focus-searching step constant, and the second focus-searching direction is opposite to the first focus-searching direction.
    Type: Application
    Filed: December 12, 2007
    Publication date: June 26, 2008
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Jin-Liang Chen, Chung Chu Chang, Chi Hong Tung
  • Publication number: 20080137095
    Abstract: A method for out-of-plane displacement detection is disclosed. The out-of-plane displacement is detected by analyzing all the fringe density indexes calculated using the frequency-domain information extracted from a series of interference images of the sample vibrating at different frequencies. The present invention further discloses a method and an apparatus for resonant frequency identification by detecting the peak value of all the fringe indexes calculated at different scanning frequencies. With the identified resonant frequency, the full-field vibratory surface profile of the sample in various resonance modes can be reconstructed.
    Type: Application
    Filed: November 28, 2007
    Publication date: June 12, 2008
    Inventors: Liang-Chia Chen, Chung-Chu Chang, Yao-Ting Huang, Jin-Liang Chen
  • Patent number: 7187451
    Abstract: An apparatus for measuring a two-dimensional displacement is disclosed and includes a laser light source, a collimator lens, a beam splitter, a plurality of staggered conjugate optic lens and a plurality of interference optical dephasing modules. The laser light source provides a laser light incident on the collimator lens to generate collimated laser beams. Each of the collimated laser beams are incident on the beam splitter to be separated into two incident beams and incident on a two-dimensional diffraction unit to generate a plurality of first diffracted beams and a plurality of second-order diffracted beams. The staggered conjugate optic lens are used to reflect the first diffracted beams so that the first diffracted beams return to the two-dimensional diffraction unit to generate a plurality of second diffracted beams where the second diffracted beams and the second-order diffracted beams generated as a result of the first diffraction of the beams stagger.
    Type: Grant
    Filed: September 8, 2004
    Date of Patent: March 6, 2007
    Assignee: Industrial Technology Reserach Institute
    Inventors: Ching-Fen Kao, Chung-Chu Chang, Ching-Fang Lin
  • Publication number: 20050062981
    Abstract: An apparatus for measuring a two-dimensional displacement is disclosed and includes a laser light source, a collimator lens, a beam splitter, a plurality of staggered conjugate optic lens and a plurality of interference optical dephasing modules. The laser light source provides a laser light incident on the collimator lens to generate collimated laser beams. Each of the collimated laser beams are incident on the beam splitter to be separated into two incident beams and incident on a two-dimensional diffraction unit to generate a plurality of first diffracted beams and a plurality of second-order diffracted beams. The staggered conjugate optic lens are used to reflect the first diffracted beams so that the first diffracted beams return to the two-dimensional diffraction unit to generate a plurality of second diffracted beams where the second diffracted beams and the second-order diffracted beams generated as a result of the first diffraction of the beams stagger.
    Type: Application
    Filed: September 8, 2004
    Publication date: March 24, 2005
    Applicant: Industrial Technology Research Institute
    Inventors: Ching-Fen Kao, Chung-Chu Chang, Ching-Fang Lin
  • Patent number: 6744520
    Abstract: A method for measuring two-dimensional displacement using conjugate optics comprises the steps of emitting an incident beam onto a diffraction element to generate many firstly diffracted beams, selecting two axially symmetric beams of the same order of diffraction from the firstly diffracted beams, introducing corresponding sets of wavefront reconstruction optics to reflect the two selected beams back onto the same incident spot along the same optical paths and to generate many secondly diffracted beams, selecting two axially symmetric pairs of beams of the same order of diffraction from the secondly diffracted beams, forming two interference fringes by superposing the two selected pairs of beams via corresponding mirrors and interferometric optics, and obtaining two linearly independent displacements of the diffraction element relative to the rest of the optics by decoding the two interference fringes.
    Type: Grant
    Filed: March 4, 2002
    Date of Patent: June 1, 2004
    Assignee: Industrial Technology Research Institute
    Inventors: Chung-Chu Chang, Ching-Fen Kao, Chih-Kung Lee
  • Publication number: 20030164950
    Abstract: A method for measuring two-dimensional displacement using conjugate optics comprises the steps of emitting an incident beam onto a diffraction element to generate many firstly diffracted beams, selecting two axially symmetric beams of the same order of diffraction from the firstly diffracted beams, introducing corresponding sets of wavefront reconstruction optics to reflect the two selected beams back onto the same incident spot along the same optical paths and to generate many secondly diffracted beams, selecting two axially symmetric pairs of beams of the same order of diffraction from the secondly diffracted beams, forming two interference fringes by superposing the two selected pairs of beams via corresponding mirrors and interferometric optics, and obtaining two linearly independent displacements of the diffraction element relative to the rest of the optics by decoding the two interference fringes.
    Type: Application
    Filed: March 4, 2002
    Publication date: September 4, 2003
    Inventors: Chung-Chu Chang, Ching-Fen Kao, Chih-Kung Lee