Patents by Inventor Chung-Fai Tse

Chung-Fai Tse has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Power quality meter and method of waveform anaylsis and compression
    Patent number: 9170986
    Abstract: A method for waveform analysis and compression includes determining harmonic components of a waveform, subtracting the harmonic components from the waveform, leaving a residual waveform, and compressing the residual waveform. Information about the harmonic components and the compressed residual transform can be transmitted across a network for analysis or reconstruction of the waveform in another device. The method is used in a low cost power quality meter, which can form part of a smart metering scheme.
    Type: Grant
    Filed: November 5, 2010
    Date of Patent: October 27, 2015
    Assignee: CITY UNIVERSITY OF HONG KONG
    Inventors: Chung-Fai Tse, Wing-Hong Lau
  • POWER QUALITY METER AND METHOD OF WAVEFORM ANAYLSIS AND COMPRESSION
    Publication number: 20110112779
    Abstract: A method for waveform analysis and compression includes determining harmonic components of a waveform, subtracting the harmonic components from the waveform, leaving a residual waveform, and compressing the residual waveform. Information about the harmonic components and the compressed residual transform can be transmitted across a network for analysis or reconstruction of the waveform in another device. The method is used in a low cost power quality meter, which can form part of a smart metering scheme.
    Type: Application
    Filed: November 5, 2010
    Publication date: May 12, 2011
    Applicant: CITY UNIVERSITY OF HONG KONG
    Inventors: Chung-Fai Tse, Wing-Hong Lau