Abstract: A customer service module used to handle a service for maintenance and repair of a wireless communication device requested by a customer is disclosed. The customer service module comprises a database storing at least a set of status information comprising a set of failure status information and a set of maintenance and repair status information and corresponding to an identification serial number of the wireless communication device. A failure information inputting interface at a service terminal is used to input the set of failure status information and a maintenance and repair status inputting interface at a maintenance and repair terminal is used to input the set of maintenance and repair status information. A status displaying interface is located at the service terminal and the maintenance and repair terminal respectively and used to display the set of failure status information or the set of maintenance and repair information according to the identification serial number.

Abstract: A method and system of monitoring apparatuses of manufacturing integrated circuit (IC) detects the problems during wafers processing by replaying the apparatus events. First, the method and system download the data of apparatus events, and then calculate the achievement indices. Then, the method and system establish the control chart to determined limitative rules, and execute the replaying system by establishing the computer interface system therewith to detect the abnormal point so as to proceed a rectification. The method and system of monitoring apparatuses of manufacturing IC review the past achievements by establishing a model for replaying apparatus history and achievements, and foresee the future problems by establishing control charts and a knowledge archive of rules.

Abstract: A dispatching method of manufacturing integrated circuit (IC) by push and pull two-way is to decide the dispatching orders of lots of wafers in each workstation. First, the priorities of lots of wafers is determined, and then the dispatching method of manufacturing IC by push and pull two-way is proceeded to run several push steps and pull steps. The push step is to dispatch wafers directly from upper process, no matter the lower units are crowded or delayed. On the other hand, the pull step is first to concern deficiencies in the lower unit, and then to dispatch wafers from the upper units. After proceeding the push steps and the pull steps, the other lots of wafers are dispatched by their original priorities. The dispatching method of manufacturing IC by push and pull two-way has the advantage of increasing the utilities of equipments.

Abstract: A dispatching method of manufacturing integrated circuit (IC) by push and pull two-way is to decide the dispatching orders of lots of wafers in each workstation. First, the priorities of lots of wafers is determined, and then the dispatching method of manufacturing IC by push and pull two-way is proceeded to run several push steps and pull steps. The push step is to dispatch wafers directly from upper process, no matter the lower units are crowded or delayed. On the other hand, the pull step is first to concern deficiencies in the lower unit, and then to dispatch wafers from the upper units. After proceeding the push steps and the pull steps, the other lots of wafers are dispatched by their original priorities. The dispatching method of manufacturing IC by push and pull two-way has the advantage of increasing the utilities of equipments.

Abstract: A method and system of monitoring apparatuses of manufacturing integrated circuit (IC) detects the problems during wafers processing by replaying the apparatus events. First, the method and system download the data of apparatus events, and then calculate the achievement indices. Then, the method and system establish the control chart to determined limitative rules, and execute the replaying system by establishing the computer interface system therewith to detect the abnormal point so as to proceed a rectification. The method and system of monitoring apparatuses of manufacturing IC review the past achievements by establishing a model for replaying apparatus history and achievements, and foresee the future problems by establishing control charts and a knowledge archive of rules.