Patents by Inventor Chung Kai HAN

Chung Kai HAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inspection apparatus and inspection method thereof
    Patent number: 11231468
    Abstract: Inspection apparatus is provided for inspecting a first electronic device and a second electronic device. The inspection apparatus includes a first signal transfer unit, a second signal transfer unit, a first signal output unit and a second signal output unit. The first signal transfer unit is adapted to receive a first input signal. The second signal transfer unit is adapted to receive a second input signal. The first signal output unit is selectively coupled to the first signal transfer unit or the second signal transfer unit to output a first output signal to inspect the first electronic device. The second signal output unit is selectively coupled to the first signal transfer unit or the second signal transfer unit to output a second output signal to inspect the second electronic device. The inspection apparatus can realize automatic inspection.
    Type: Grant
    Filed: June 26, 2019
    Date of Patent: January 25, 2022
    Assignee: WISTRON CORP.
    Inventors: Chung Kai Han, Yu Shan Huang, Po-Chuan Ku, Chun Yen Tsai
  • INSPECTION APPARATUS AND INSPECTION METHOD THEREOF
    Publication number: 20200284848
    Abstract: Inspection apparatus is provided for inspecting a first electronic device and a second electronic device. The inspection apparatus includes a first signal transfer unit, a second signal transfer unit, a first signal output unit and a second signal output unit. The first signal transfer unit is adapted to receive a first input signal. The second signal transfer unit is adapted to receive a second input signal. The first signal output unit is selectively coupled to the first signal transfer unit or the second signal transfer unit to output a first output signal to inspect the first electronic device. The second signal output unit is selectively coupled to the first signal transfer unit or the second signal transfer unit to output a second output signal to inspect the second electronic device. The inspection apparatus can realize automatic inspection.
    Type: Application
    Filed: June 26, 2019
    Publication date: September 10, 2020
    Inventors: Chung Kai HAN, Yu Shan HUANG, Po-Chuan KU, Chun Yen TSAI