Patents by Inventor Chung-Lun Edwin Hsu

Chung-Lun Edwin Hsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • On-chip testing architecture for display system
    Patent number: 11783739
    Abstract: Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.
    Type: Grant
    Filed: August 9, 2021
    Date of Patent: October 10, 2023
    Assignee: Apple Inc.
    Inventors: Hasan Akyol, Xuebei Yang, Chung-Lun Edwin Hsu, Henry C. Jen, John T. Wetherell
  • Circuitry for screening defective portion of display chip
    Patent number: 11657742
    Abstract: Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.
    Type: Grant
    Filed: August 11, 2021
    Date of Patent: May 23, 2023
    Assignee: Apple Inc.
    Inventors: Hasan Akyol, Chung-Lun Edwin Hsu, Baris Cagdaser, John T. Wetherell, Xuebei Yang, Ali Tabatabaei, Patrick Bryce Bennett, Yingkan Lin, Chun-Ming Tang, Xiaofeng Wang, Hopil Bae
  • PIXEL SCREENING AND REPAIR
    Publication number: 20220101790
    Abstract: Systems and methods may reduce or eliminate image artifacts due to a defective pixel of an electronic display. An electronic display may include pixels that respectively include a self-emissive element, pixel drive circuitry that supplies a pixel drive current to drive the self-emissive element, and signal routing circuitry that reduces or eliminates a visual artifact due to a defective pixel among the pixels. The signal routing circuitry may do this by turning off the self-emissive element, supplying image data from the pixel drive circuitry to a first adjacent pixel, or receiving image data from other pixel drive circuitry from the first adjacent pixel or a second adjacent pixel.
    Type: Application
    Filed: September 10, 2021
    Publication date: March 31, 2022
    Inventors: John T. Wetherell, Cheuk Chi Lo, Chun-Yao Huang, Lingtao Wang, Derek Keith Shaeffer, Henry C. Jen, Hasan Akyol, Xuebei Yang, Chung-Lun Edwin Hsu, Patrick Bryce Bennett, Chun-Ming Tang, Yingkan Lin, Sheng Zhang, Chaohao Wang, Runjie Xu, Shingo Hatanaka
  • ON-CHIP TESTING ARCHITECTURE FOR DISPLAY SYSTEM
    Publication number: 20220076599
    Abstract: Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.
    Type: Application
    Filed: August 9, 2021
    Publication date: March 10, 2022
    Inventors: Hasan Akyol, Xuebei Yang, Chung-Lun Edwin Hsu, Henry C. Jen, John T. Wetherell