Patents by Inventor Chung-Lun Kuo

Chung-Lun Kuo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11507020
    Abstract: An optical measurement system comprises a polarization beam splitter for dividing an incident beam into a reference beam and a measurement beam, a first beam splitter for reflecting the measurement beam to form a first reflected measurement beam, a spatial light modulator for modulating the first reflected measurement beam to form a modulated measurement beam, a condenser lens for focusing the modulated measurement beam to an object to form a penetrating measurement beam, an objective lens for converting the penetrating measurement beam into a parallel measurement beam, a mirror for reflecting the parallel measurement beam to form an object beam, a second beam splitter for reflecting the reference beam to a path coincident with that of the object beam, and a camera for receiving an interference signal generated by the reference beam and the object beam to generate an image of the object.
    Type: Grant
    Filed: September 22, 2020
    Date of Patent: November 22, 2022
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Hsiang-Chun Wei, Chung-Lun Kuo, Chia-Hung Cho, Chun-Wei Lo, Chih-Hsiang Liu
  • Publication number: 20220365546
    Abstract: Semiconductor processing systems and methods are provided in which an amount or concentration of a chemical in a chemical mixture contained in a tank is automatically controlled based on a sensed properties of the chemical mixture. In some embodiments, a semiconductor processing system includes a processing tank that is configured to contain a chemical mixture. A chemical sensor is configured to sense one or more properties of the chemical mixture. The system further includes an electrically controllable valve that is configured to adjust an amount of the first chemical in the chemical mixture based on the sensed one or more properties of the chemical mixture.
    Type: Application
    Filed: August 1, 2022
    Publication date: November 17, 2022
    Inventors: Chia-Lun CHEN, Cheng-Hao KUO, Chung-Hao HU
  • Patent number: 11474144
    Abstract: An inspection apparatus including an illumination light source, a sensing probe and a processing device is provided. The illumination light source emits an illumination beam to simultaneously irradiate the plurality of light-emitting diode. The sensing probe is configured to measure a charge distribution, an electric field distribution, or a voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. The processing device determines a plurality of electro-optical characteristics of the plurality of light-emitting diodes through the charge distribution, the electric field distribution, or the voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. Moreover, a method of for inspecting light-emitting diodes is also provided.
    Type: Grant
    Filed: June 19, 2020
    Date of Patent: October 18, 2022
    Assignee: Industrial Technology Research Institute
    Inventors: Yan-Rung Lin, Chung-Lun Kuo, Chih-Hsiang Liu, Shie-Chang Jeng
  • Publication number: 20210231570
    Abstract: An inspection apparatus for inspecting a light-emitting diode wafer is provided. The inspection apparatus includes a Z-axis translation stage, a sensing probe, a height measurement module, a carrier, an illumination light source, and a processing device. The sensing probe is integrated with the Z-axis translation stage. The Z-axis translation stage is adapted to drive the sensing probe to move in a Z axis. The sensing probe includes a photoelectric sensor, a beam splitter, and a photoelectric sensing structure. One of the photoelectric sensor of the sensing probe and the height measurement module is adapted to receive a light beam penetrating the beam splitter, and the other one of the photoelectric sensor of the sensing probe and the height measurement module is adapted to receive a light beam reflected by the beam splitter. The carrier is configured to carry the light-emitting diode wafer. The illumination light source is configured to emit an illumination beam to irradiate the light-emitting diode wafer.
    Type: Application
    Filed: December 28, 2020
    Publication date: July 29, 2021
    Applicant: Industrial Technology Research Institute
    Inventors: Yan-Rung Lin, Chih-Hsiang Liu, Chung-Lun Kuo, Hsiang-Chun Wei, Yeou-Sung Lin, Chieh-Yi Lo
  • Publication number: 20210149337
    Abstract: An optical measurement system comprises a polarization beam splitter for dividing an incident beam into a reference beam and a measurement beam, a first beam splitter for reflecting the measurement beam to form a first reflected measurement beam, a spatial light modulator for modulating the first reflected measurement beam to form a modulated measurement beam, a condenser lens for focusing the modulated measurement beam to an object to form a penetrating measurement beam, an objective lens for converting the penetrating measurement beam into a parallel measurement beam, a mirror for reflecting the parallel measurement beam to form an object beam, a second beam splitter for reflecting the reference beam to a path coincident with that of the object beam, and a camera for receiving an interference signal generated by the reference beam and the object beam to generate an image of the object.
    Type: Application
    Filed: September 22, 2020
    Publication date: May 20, 2021
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Hsiang-Chun WEI, Chung-Lun KUO, Chia-Hung CHO, Chun-Wei LO, Chih-Hsiang LIU
  • Publication number: 20200371152
    Abstract: An inspection apparatus including an illumination light source, a sensing probe and a processing device is provided. The illumination light source emits an illumination beam to simultaneously irradiate the plurality of light-emitting diode. The sensing probe is configured to measure a charge distribution, an electric field distribution, or a voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. The processing device determines a plurality of electro-optical characteristics of the plurality of light-emitting diodes through the charge distribution, the electric field distribution, or the voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. Moreover, a method of for inspecting light-emitting diodes is also provided.
    Type: Application
    Filed: June 19, 2020
    Publication date: November 26, 2020
    Applicant: Industrial Technology Research Institute
    Inventors: Yan-Rung Lin, Chung-Lun Kuo, Chih-Hsiang Liu, Shie-Chang Jeng
  • Patent number: 10474231
    Abstract: An eye tracking apparatus and an eye tracking method for the eye tracking apparatus are provided. The eye tracking apparatus includes an image capture device and a computing device. The image capture device is adapted to capture at least one face image. The computing device is coupled to the image capture device. The computing device receives the face image to obtain an eye image and identifies at least one iris region of the eye image. The computing device chooses the largest iris region from the iris regions to obtain a fitting pattern of the largest iris region and obtains a gaze point of the eye image based on the fitting pattern.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: November 12, 2019
    Assignee: Industrial Technology Research Institute
    Inventors: Hsiao-Wei Liu, Yu-Ying Lan, Hsin-Cheng Lin, Chung-Lun Kuo, Chia-Liang Yeh
  • Publication number: 20190056781
    Abstract: An eye tracking apparatus and an eye tracking method for the eye tracking apparatus are provided. The eye tracking apparatus includes an image capture device and a computing device. The image capture device is adapted to capture at least one face image. The computing device is coupled to the image capture device. The computing device receives the face image to obtain an eye image and identifies at least one iris region of the eye image. The computing device chooses the largest iris region from the iris regions to obtain a fitting pattern of the largest iris region and obtains a gaze point of the eye image based on the fitting pattern.
    Type: Application
    Filed: December 19, 2017
    Publication date: February 21, 2019
    Applicant: Industrial Technology Research Institute
    Inventors: Hsiao-Wei Liu, Yu-Ying Lan, Hsin-Cheng Lin, Chung-Lun Kuo, Chia-Liang Yeh
  • Patent number: 7469376
    Abstract: A computer-based system and method for generating a primary document characterizing a device from multiple secondary documents is provided. In one example, the method includes defining a primary document template and multiple input files. Each input file defines the source and type of information for a section of the primary document template. A document generation engine parses the secondary documents and inserts information from them into the primary document template based on the input files. After the primary document is generated, related technologies or devices may be identified and notified of changes to the device in the primary document. The related technologies or devices may then be updated if desired.
    Type: Grant
    Filed: March 19, 2004
    Date of Patent: December 23, 2008
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yu-Tai Chia, Tse-Lun Tsai, Chung-Lun Kuo, Shiun-Huan Lai
  • Publication number: 20050206957
    Abstract: A computer-based system and method for generating a primary document characterizing a device from multiple secondary documents is provided. In one example, the method includes defining a primary document template and multiple input files. Each input file defines the source and type of information for a section of the primary document template. A document generation engine parses the secondary documents and inserts information from them into the primary document template based on the input files. After the primary document is generated, related technologies or devices may be identified and notified of changes to the device in the primary document. The related technologies or devices may then be updated if desired.
    Type: Application
    Filed: March 19, 2004
    Publication date: September 22, 2005
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yu-Tai Chia, Tse-Lun Tsai, Chung-Lun Kuo, Shiun-Huan Lai