Patents by Inventor Chung-Seog Oh

Chung-Seog Oh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Atomic force microscope with probe with improved tip movement
    Patent number: 7246517
    Abstract: An atomic force microscope probe provides an indentation testing function in a direction along an axis. The probe has a tip and an arm structure holding the tip. The arm structure has one end mounted on a fixed stage, the other end coupled to the AFM tip, and a hollow frame having a shape symmetric with respect to a plane including an axis on which the two ends are positioned.
    Type: Grant
    Filed: June 19, 2006
    Date of Patent: July 24, 2007
    Assignee: Korea Institute of Machinery & Materials
    Inventors: Hak-Joo Lee, Jae-Hyun Kim, Chung-Seog Oh, Seung-Woo Han, Shin Hur, Soon-Gyu Ko, Byung-Ik Choi
  • Atomic force microscope with probe with improved tip movement
    Publication number: 20060243036
    Abstract: An atomic force microscope probe provides an indentation testing function in a direction along an axis. The probe has a tip and an arm structure holding the tip. The arm structure has one end mounted on a fixed stage, the other end coupled to the AFM tip, and a hollow frame having a shape symmetric with respect to a plane including an axis on which the two ends are positioned.
    Type: Application
    Filed: June 19, 2006
    Publication date: November 2, 2006
    Inventors: Hak-Joo Lee, Jae-Hyun Kim, Chung-Seog Oh, Seung-Woo Han, Shin Hur, Soon-Gyu Ko, Byung-Ik Choi