Patents by Inventor Chung-Yin Chang

Chung-Yin Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240186453
    Abstract: A light-emitting device includes a semiconductor laminate, a first electrode and a second electrode. The semiconductor laminate has a mesa surface, an upper surface, a connecting surface that connects the upper surface and the mesa surface, and a lower surface opposite to the mesa surface and the upper surface. The semiconductor laminate includes a first semiconductor layer, an active layer, and a second semiconductor layer disposed in such order in a direction from the lower surface to the upper surface. The semiconductor laminate has at least one trench that extends from the mesa surface into the first semiconductor layer. The first electrode is electrically connected to the first semiconductor layer and formed on the mesa surface, and has an extending portion that extends into the trench. The second electrode is electrically connected to the second semiconductor layer and formed on the upper surface.
    Type: Application
    Filed: November 30, 2023
    Publication date: June 6, 2024
    Inventors: Gong CHEN, Jianbin CHEN, Yashu ZANG, Bin JIANG, Chung-Yin CHANG, Shaohua HUANG, Weichun TSENG
  • Patent number: 11904482
    Abstract: A mechanical arm calibration system and a mechanical arm calibration method are provided. The method includes: locating a position of an end point of a mechanical arm in a three-dimensional space to calculate an actual motion trajectory of the end point when the mechanical arm is operating; retrieving link parameters of the mechanical arm, randomly generating sets of particles including compensation amounts for the link parameters through particle swarm optimization (PSO), importing the compensation amounts of each of the sets of particles into forward kinematics after addition of the corresponding link parameters, to calculate an adaptive motion trajectory of the end point; calculating position errors between the adaptive motion trajectory and the actual motion trajectory of each of the sets of particles for a fitness value of the PSO to estimate a group best position; and updating the link parameters by the compensation amounts corresponding to the group best position.
    Type: Grant
    Filed: April 1, 2021
    Date of Patent: February 20, 2024
    Assignee: Industrial Technology Research Institute
    Inventors: Jun-Yi Jiang, Yen-Cheng Chen, Chung-Yin Chang, Guan-Wei Su, Qi-Zheng Yang
  • Publication number: 20220203544
    Abstract: A mechanical arm calibration system and a mechanical arm calibration method are provided. The method includes: locating a position of an end point of a mechanical arm in a three-dimensional space to calculate an actual motion trajectory of the end point when the mechanical arm is operating; retrieving link parameters of the mechanical arm, randomly generating sets of particles including compensation amounts for the link parameters through particle swarm optimization (PSO), importing the compensation amounts of each of the sets of particles into forward kinematics after addition of the corresponding link parameters, to calculate an adaptive motion trajectory of the end point; calculating position errors between the adaptive motion trajectory and the actual motion trajectory of each of the sets of particles for a fitness value of the PSO to estimate a group best position; and updating the link parameters by the compensation amounts corresponding to the group best position.
    Type: Application
    Filed: April 1, 2021
    Publication date: June 30, 2022
    Applicant: Industrial Technology Research Institute
    Inventors: Jun-Yi Jiang, Yen-Cheng Chen, Chung-Yin Chang, Guan-Wei Su, Qi-Zheng Yang
  • Patent number: 11289303
    Abstract: A calibrating method is provided including the following steps. A type of a first sensor and a type of a first sensor carrier are determined according to an external shape of a first object. The first sensor is carried by the first sensor carrier, and a relative coordinate of the first object is measured by the first sensor. The relative coordinate of the first object is compared with a predetermined coordinate of the first object to obtain a first object coordinate error, and the first object coordinate error is corrected. After the first object coordinate error is corrected, the first object is driven to perform an operation on a second object or the second object is driven to perform the operation on the first object. A calibrating system is also provided.
    Type: Grant
    Filed: March 10, 2020
    Date of Patent: March 29, 2022
    Assignee: Industrial Technology Research Institute
    Inventors: Yen-Cheng Chen, Chung-Yin Chang, Jun-Yi Jiang, Qi-Zheng Yang, Kai-Ming Pan, Chen-Yu Kai
  • Publication number: 20210225607
    Abstract: A calibrating method is provided including the following steps. A type of a first sensor and a type of a first sensor carrier are determined according to an external shape of a first object. The first sensor is carried by the first sensor carrier, and a relative coordinate of the first object is measured by the first sensor. The relative coordinate of the first object is compared with a predetermined coordinate of the first object to obtain a first object coordinate error, and the first object coordinate error is corrected. After the first object coordinate error is corrected, the first object is driven to perform an operation on a second object or the second object is driven to perform the operation on the first object. A calibrating system is also provided.
    Type: Application
    Filed: March 10, 2020
    Publication date: July 22, 2021
    Applicant: Industrial Technology Research Institute
    Inventors: Yen-Cheng Chen, Chung-Yin Chang, Jun-Yi Jiang, Qi-Zheng Yang, Kai-Ming Pan, Chen-Yu Kai