Patents by Inventor Chunhe Gong

Chunhe Gong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7254209
    Abstract: A computed tomography (CT) reconstruction method includes implementing an iterative image reconstruction process for CT metrology of an object, wherein the iterative reconstruction process utilizes accurate forward projection. During each of a plurality of iterations, a reconstructed image is constrained by utilizing prior outer edge information obtained from a modality in addition to CT, and then transformed to a projection domain so as to generate a calculated sinogram. A correction image is determined based on the calculated sinogram and a measured sinogram.
    Type: Grant
    Filed: November 17, 2003
    Date of Patent: August 7, 2007
    Assignee: General Electric Company
    Inventors: Qi Zhao, Chunhe Gong, Bruno De Man, Samit Kumar Basu, Fracis Howard Little
  • Patent number: 7215732
    Abstract: A method for reconstructing image data from measured sinogram data acquired from a CT system is provided. The CT system is configured for industrial imaging. The method includes pre-processing the measured sinogram data. The pre-processing includes performing a beam hardening correction on the measured sinogram data and performing a detector point spread function (PSF) correction and a detector lag correction on the measured sinogram data. The pre-processed sinogram data is reconstructed to generate the image data.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: May 8, 2007
    Assignee: General Electric Company
    Inventors: Zhye Yin, Jong Chul Ye, Francis Howard Little, Forrest Frank Hopkins, Michael Chunhe Gong, Yanfeng Du
  • Publication number: 20050105693
    Abstract: A computed tomography (CT) reconstruction method includes implementing an iterative image reconstruction process for CT metrology of an object, wherein the iterative reconstruction process utilizes accurate forward projection. During each of a plurality of iterations, a reconstructed image is constrained by utilizing prior outer edge information obtained from a modality in addition to CT, and then transformed to a projection domain so as to generate a calculated sinogram. A correction image is determined based on the calculated sinogram and a measured sinogram.
    Type: Application
    Filed: November 17, 2003
    Publication date: May 19, 2005
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Qi Zhao, Chunhe Gong, Bruno De Man, Samit Basu, Francis Little
  • Patent number: 6826510
    Abstract: A method for performing geometric dimension and tolerance stack-up analysis for an assembly, the method comprising receiving a target assembly dimension for stack-up analysis, where the assembly includes at least one part. The method further comprises receiving a feature corresponding to the part and receiving feature tolerance data associated with the feature. The feature tolerance data includes at least one of size tolerance and geometric tolerance. Stack-up rules are accessed in response to receiving the feature tolerance data. The stack-up rules include instructions to determine if a form tolerance, an orientation tolerance and a profile tolerance should be included in a stack-up tolerance for the feature. The stack-up rules also include formulas to calculate a nominal dimension and the stack-up tolerance for the feature when the feature tolerance data applies to features of sizes.
    Type: Grant
    Filed: November 14, 2002
    Date of Patent: November 30, 2004
    Assignee: General Electric Company
    Inventors: Chunhe Gong, Narendra Amalendu Soman, Dean Michael Robinson
  • Publication number: 20040098220
    Abstract: A method for performing geometric dimension and tolerance stack-up analysis for an assembly, the method comprising receiving a target assembly dimension for stack-up analysis, where the assembly includes at least one part. The method further comprises receiving a feature corresponding to the part and receiving feature tolerance data associated with the feature. The feature tolerance data includes at least one of size tolerance and geometric tolerance. Stack-up rules are accessed in response to receiving the feature tolerance data. The stack-up rules include instructions to determine if a form tolerance, an orientation tolerance and a profile tolerance should be included in a stack-up tolerance for the feature. The stack-up rules also include formulas to calculate a nominal dimension and the stack-up tolerance for the feature when the feature tolerance data applies to features of sizes.
    Type: Application
    Filed: November 14, 2002
    Publication date: May 20, 2004
    Inventors: Chunhe Gong, Narendra Amalendu Soman, Dean Michael Robinson