Abstract: A memory decoding system includes a memory decoding reference current module. The memory decoding reference current module includes: a first reference current unit connected to one end of a second reference bit line; a second reference current unit connected to one end of a first reference bit line; a third reference current unit connected to one end of a third reference bit line; a first reference NMOS transistor, a source of which is connected to the second reference bit line; a second reference NMOS transistor, a source of which is connected to a drain of the first reference NMOS transistor; and a gate of the first reference NMOS transistor and a gate of the second NMOS transistor are connected to a logic high level.

Abstract: A memory decoding system includes a memory decoding reference current module. The memory decoding reference current module includes: a first reference current unit connected to one end of a second reference bit line; a second reference current unit connected to one end of a first reference bit line; a third reference current unit connected to one end of a third reference bit line; a first reference NMOS transistor, a source of which is connected to the second reference bit line; a second reference NMOS transistor, a source of which is connected to a drain of the first reference NMOS transistor; and a gate of the first reference NMOS transistor and a gate of the second NMOS transistor are connected to a logic high level.

Abstract: A memory device may include the following elements: a first memory cell; a first word line for transmitting a first control signal to control an electrical connection in the first memory cell; a first bit line connected to the first memory cell; a first transistor, wherein a first terminal of the first transistor is connected to the first bit line; a second memory cell; a second word line for transmitting a second control signal to control an electrical connection in the second memory cell; a second bit line connected to the second memory cell; a second transistor, wherein a first terminal of the second transistor is connected to the second bit line; and a sense amplifier having a first input terminal connected to a second terminal of the first transistor and having a second input terminal connected to a second terminal of the second transistor.

Abstract: The present disclosure provides control methods and control apparatus thereof and reference current modules of memory decoding systems. An exemplary control method of a memory decoding system comprising a decoder having at least a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, a second NMOS transistor and a fourth NMOS transistor, a memory cell, and at least a first bit line and a second bit line, includes applying a first control signal, being at a logic low level during a first read operation stage of a read operation and at a logic high level during a second read operation stage after the first read operation stage of the read operation, to a gate of the first PMOS transistor; applying a second control signal to a gate of the second PMOS transistor; and applying a fourth control signal to a gate of the first NMOS transistor.

Abstract: A memory device may include the following elements: a first memory cell; a first word line for transmitting a first control signal to control an electrical connection in the first memory cell; a first bit line connected to the first memory cell; a first transistor, wherein a first terminal of the first transistor is connected to the first bit line; a second memory cell; a second word line for transmitting a second control signal to control an electrical connection in the second memory cell; a second bit line connected to the second memory cell; a second transistor, wherein a first terminal of the second transistor is connected to the second bit line; and a sense amplifier having a first input terminal connected to a second terminal of the first transistor and having a second input terminal connected to a second terminal of the second transistor.

Abstract: The present disclosure provides control methods and control apparatus thereof and reference current modules of memory decoding systems. An exemplary control method of a memory decoding system comprising a decoder having at least a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, a second NMOS transistor and a fourth NMOS transistor, a memory cell, and at least a first bit line and a second bit line, includes applying a first control signal, being at a logic low level during a first read operation stage of a read operation and at a logic high level during a second read operation stage after the first read operation stage of the read operation, to a gate of the first PMOS transistor; applying a second control signal to a gate of the second PMOS transistor; and applying a fourth control signal to a gate of the first NMOS transistor.

Abstract: A memory device may include the following elements: a first memory cell; a first word line for transmitting a first control signal to control an electrical connection in the first memory cell; a first bit line connected to the first memory cell; a first transistor, wherein a first terminal of the first transistor is connected to the first bit line; a second memory cell; a second word line for transmitting a second control signal to control an electrical connection in the second memory cell; a second bit line connected to the second memory cell; a second transistor, wherein a first terminal of the second transistor is connected to the second bit line; and a sense amplifier having a first input terminal connected to a second terminal of the first transistor and having a second input terminal connected to a second terminal of the second transistor.

Abstract: A memory device may include the following elements: a first memory cell; a first word line for transmitting a first control signal to control an electrical connection in the first memory cell; a first bit line connected to the first memory cell; a first transistor, wherein a first terminal of the first transistor is connected to the first bit line; a second memory cell; a second word line for transmitting a second control signal to control an electrical connection in the second memory cell; a second bit line connected to the second memory cell; a second transistor, wherein a first terminal of the second transistor is connected to the second bit line; and a sense amplifier having a first input terminal connected to a second terminal of the first transistor and having a second input terminal connected to a second terminal of the second transistor.

Abstract: A control integrated circuit for controlling a switch power supply, including: a voltage collecting module, configured to collect a feedback voltage based on an output voltage of the switch power supply; an error amplifying module, configured to compare the feedback voltage with a reference voltage and generate an error voltage; a time collecting module, configured to obtain a degaussing time signal based on the feedback voltage; and a constant voltage and current module, configured to collect a peak current feedback signal of a switch transistor, generate a control signal based on the error voltage, the degaussing time signal and the peak current feedback signal, wherein the control signal is for controlling an operating frequency and a duty ratio of the switch transistor, and control the switch transistor according to the control signal.

Abstract: A control integrated circuit for controlling a switch power supply, including: a voltage collecting module, configured to collect a feedback voltage based on an output voltage of the switch power supply; an error amplifying module, configured to compare the feedback voltage with a reference voltage and generate an error voltage; a time collecting module, configured to obtain a degaussing time signal based on the feedback voltage; and a constant voltage and current module, configured to collect a peak current feedback signal of a switch transistor, generate a control signal based on the error voltage, the degaussing time signal and the peak current feedback signal, wherein the control signal is for controlling an operating frequency and a duty ratio of the switch transistor, and control the switch transistor according to the control signal.