Patents by Inventor Chyi N. Sheng

Chyi N. Sheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7551895
    Abstract: A method of communicating in a mobile ad-hoc network is disclosed. It is determined whether a first directional transmission path between a transmitting node and a destination node is known to be free from obstruction. The transmitting node transmits a message to the destination node using the first directional transmission path. The message is retransmitted to the destination node using the first directional transmission path when a message receipt acknowledgement in an omnidirectional network transmission has not been received within a predetermined time. Additional transmissions via the first directional transmission path are blocked when the message receipt acknowledgement has not been received after more than a pre-set number of retransmissions. The message is transmitted to a proxy node using a second directional transmission path between the transmitting node and the proxy node, with instructions for the proxy node to directionally transmit the message to the destination node.
    Type: Grant
    Filed: September 1, 2006
    Date of Patent: June 23, 2009
    Assignee: Rockwell Collins, Inc.
    Inventors: Steven VanLaningham, Chyi N. Sheng, John L. Tipton, Alan D. Amis
  • Patent number: 5027132
    Abstract: A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. Inspection can also be done by substage illumination with non-laser light. A database, organized into frames and strips, represents an ideal pattern as one or more polygons. Each polygon's data decription is contained within a single data frame. The database is transformed into a turnpoint polygon representation, then a left and right vector representation, then an addressed pixel representation, then a bit-mapped representation of the entire target. Most of the transformations are carried out in parallel pipelines. Guardbands around polygon sides are used for error filtering during inspection. Guardbands are polygons, and frames containing only guardband information are sent down dedicated pipelines. Error filtering also is done at the time of pixel comparisons of ideal with real patterns, and subsequently during defect area consolidation.
    Type: Grant
    Filed: August 31, 1989
    Date of Patent: June 25, 1991
    Assignee: Texas Instruments Incorporated
    Inventors: William G. Manns, Don J. Weeks, Jerry D. Merryman, Chyi N. Sheng
  • Patent number: 5001764
    Abstract: A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. Inspection can also be done by substage illumination with non-laser light. A database, organized into frames and strips, represents an ideal pattern as one or more polygons. Each polygon's data description is contained within a single data frame. The database is transformed into a turnpoint polygon representation, then a left and right vector representation, then an addressed pixel representation, then a bit-mapped representation of the entire target. Most of the transformations are carried out in parallel pipelines. Guardbands around polygon sides are used for error filtering during inspection. Guardbands are polygons, and frames containing only guardband information are sent down dedicated pipelines. Error filtering also is done at the time of pixel comparisons of ideal with real patterns, and subsequently during defect area consolidation.
    Type: Grant
    Filed: March 25, 1988
    Date of Patent: March 19, 1991
    Assignee: Texas Instruments Incorporated
    Inventors: Anthony B. Wood, William G. Manns, David A. Norwood, Don J. Weeks, Chyi N. Sheng
  • Patent number: 4984282
    Abstract: A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. Inspection can also be done by substage illumination with non-laser light. A database, organized into frames and strips, represents an ideal pattern as one or more polygons. Each polygon's data description is contained within a single data frame. The database is transformed into a turnpoint polygon representation, then a left and right vector representation, then an addressed pixel representation, then a bit-mapped representation of the entire target. Most of the transformations are carried out in parallel pipelines. Guardbands around polygon sides are used for error filtering during inspection. Guardbands are polygons, and frames containing only guardband information are sent down dedicated pipelines. Error filtering also is done at the time of pixel comparisons of ideal with real patterns, and subsequently during defect area consolidation.
    Type: Grant
    Filed: March 25, 1988
    Date of Patent: January 8, 1991
    Assignee: Texas Instruments Incorporated
    Inventors: William G. Manns, David A. Norwood, Don J. Weeks, Chyi N. Sheng, Anthony B. Wood