Patents by Inventor Cien SUN

Cien SUN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Polygonal spherical space sampling device
    Patent number: 11442094
    Abstract: This application provides a polygonal spherical sampling device, belonging to the technical field of spherical field antenna measurement, and including a probe, a mounting rack and a supporting platform. The supporting platform is mounted on the mounting rack for placing an object to be tested. The number of the probes is more than or equal to six, the probes are mounted on the mounting rack and a plurality of the probes are distributed on at least two vertical planes in a three-dimensional spherical space and are arranged around the supporting platform. The vertical planes are arranged symmetrically about a vertical axis, the probes are uniformly distributed at intervals of A degrees on each vertical plane, the probes on a same horizontal plane are uniformly distributed at intervals of B degrees, both A and B are less than or equal to 90.
    Type: Grant
    Filed: June 1, 2021
    Date of Patent: September 13, 2022
    Assignee: Shenzhen Xinyi Technology Co., Ltd.
    Inventors: Linbin Chen, Zhenkun Xie, Daoyi Wang, Cien Sun, Kaixuan Jiang
  • POLYGONAL SPHERICAL SPACE SAMPLING DEVICE
    Publication number: 20220187355
    Abstract: This application provides a polygonal spherical sampling device, belonging to the technical field of spherical field antenna measurement, and including a probe, a mounting rack and a supporting platform. The supporting platform is mounted on the mounting rack for placing an object to be tested. The number of the probes is more than or equal to six, the probes are mounted on the mounting rack and a plurality of the probes are distributed on at least two vertical planes in a three-dimensional spherical space and are arranged around the supporting platform. The vertical planes are arranged symmetrically about a vertical axis, the probes are uniformly distributed at intervals of A degrees on each vertical plane, the probes on a same horizontal plane are uniformly distributed at intervals of B degrees, both A and B are less than or equal to 90.
    Type: Application
    Filed: June 1, 2021
    Publication date: June 16, 2022
    Applicant: Shenzhen Xinyi Technology Co., Ltd.
    Inventors: Linbin CHEN, Zhenkun XIE, Daoyi WANG, Cien SUN, Kaixuan JIANG