Patents by Inventor Clark N. Kadlec

Clark N. Kadlec has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method to measure semiconductor optical absorption using microwave charge sensing
    Patent number: 11125700
    Abstract: A time-resolved microwave reflectance apparatus comprises a pulsed or modulated optical source that irradiates a semiconductor sample with an excitation pump beam, a microwave oscillator that irradiates the sample with a continuous beam of microwaves, and a microwave detector that detects the microwaves reflected by the sample. Therefore, charge detection, rather than conventional absorption measurements (that detect the loss of photons), can be used to extract the absorption coefficient and band edge of a semiconductor material.
    Type: Grant
    Filed: August 19, 2019
    Date of Patent: September 21, 2021
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: Eric A. Shaner, Michael Goldflam, Clark N. Kadlec
  • Apparatus and Method to Measure Semiconductor Optical Absorption Using Microwave Charge Sensing
    Publication number: 20200057006
    Abstract: A time-resolved microwave reflectance apparatus comprises a pulsed or modulated optical source that irradiates a semiconductor sample with an excitation pump beam, a microwave oscillator that irradiates the sample with a continuous beam of microwaves, and a microwave detector that detects the microwaves reflected by the sample. Therefore, charge detection, rather than conventional absorption measurements (that detect the loss of photons), can be used to extract the absorption coefficient and band edge of a semiconductor material.
    Type: Application
    Filed: August 19, 2019
    Publication date: February 20, 2020
    Inventors: Eric A. Shaner, Michael Goldflam, Clark N. Kadlec