Abstract: The method for manufacturing a three-dimensional object or for modifying the surface state of a preformed object by local polymerisation of monomers or oligomers, the polymerisation being initiated by mono-photon or multi-photon absorption in an area to be polymerised, includes: —introducing into a vessel with light-transparent walls a reaction medium comprising polymerisable monomers or oligomers, a polymerisation inhibitor, an indicator of the amount of the inhibitor and a photochemical polymerisation initiator; —initiating the polymerisation of the monomers or oligomers; —indicating the amount of inhibitor present in the reaction medium; —controlling the amount of light emitted by the irradiation system relative to the amount of inhibitor indicated by the indicator; and —switching to a following zone to be polymerised by moving the object and/or the focused light beam.

Abstract: The present invention relates to a method for producing a three-dimensional object comprising the following operations: a. introducing a composition (11) into a polymerization vessel (9), b. polymerizing the composition (11) by multiphoton photopolymerization, at predetermined locations, in order to produce the three-dimensional object (3), the composition (11) comprising at least one monomer, at least one filler and at least one photoinitiator, —characterized in that: the difference between the refractive indices of the monomer and of the filler present is less than 0.05; —the viscosity of the composition (11) is greater than or equal to 0.05 Pa·s; —the composition (11) is transparent to the photopolymerization wavelength.

Abstract: The invention relates to an optical device for characterization of a sample (3) comprising —a source (5) of parallel or collimated light, having an emission spectrum that is continuous over an observation wavelength range of at least 50 nm width, for illuminating the sample (3), —a detector (7) of light scattered by the sample (3), operating in said observation wavelength range, —a filter (9) for specific spectral weighting arranged on an optical path upstream of the detector (7) of the scattered light, and —a processing unit (11) for processing the measurement signal in order to extract a characterization parameter of the sample (3).

Abstract: A contrast-amplifying support for the observation of a sample, comprises a transparent substrate carrying at least one absorbing layer whose complex refractive index N1=n1?jk1 and thickness are chosen in such a way that the layer behaves in the guise of antireflection layer when it is illuminated under normal incidence at an illumination wavelength ? through the substrate, the face of the layer opposite to the d substrate being in contact with a transparent so-called ambient medium whose refractive index n3 is less than that of the refractive index n0 of the substrate. Methods for producing a contrast-amplifying support and for observing a sample, or for detecting or assaying at least one chemical or biological species, using such a contrast-amplifying support are provided.

Abstract: The invention relates to an optical device for characterization of a sample (3) comprising—a source (5) of parallel or collimated light, having an emission spectrum that is continuous over an observation wavelength range of at least 50 nm width, for illuminating the sample (3),—a detector (7) of light scattered by the sample (3), operating in said observation wavelength range,—a filter (9) for specific spectral weighting arranged on an optical path upstream of the detector (7) of the scattered light, and—a processing unit (11) for processing the measurement signal in order to extract a characterization parameter of the sample (3).

Abstract: A method for producing a contrast-amplifying support comprising an absorbing substrate carrying at least one absorbing layer comprises a design step for the support and the following steps: i) choosing an illumination wavelength ?; ii) choosing a material constituting the substrate and exhibiting, at illumination wavelength ?, a complex refractive index N0=n0?jk0 with k0?0.01; iii) choosing an ambient medium in contact with the layer on the side opposite to the substrate and exhibiting, at illumination wavelength ?, a complex refractive index N3=n3?jk3 with k3?0; iv) determining a nominal complex refractive index N1=n1?jk1 and a nominal thickness e1 of the layer wherein it behaves in the guize of antireflection layer when illuminated under normal incidence at illumination wavelength ?; and v) choosing a material constituting the layer and exhibiting, at illumination wavelength ?, a complex refractive index whose real and imaginary parts coincide with the nominal complex refractive index.

Abstract: The invention relates to a method for observing a sample under optical microscopy, in incoherent, unpolarised light, using a sample substrate including a contrast-amplifying layer having a complex index of refraction. The invention also relates to a method for detecting or metering at least one chemical or biological species using such a sample substrate.

Abstract: A contrast-amplifying support for the observation of a sample, comprises a transparent substrate carrying at least one absorbing layer whose complex refractive index N1=n1?jk1 and thickness are chosen in such a way that the layer behaves in the guise of antireflection layer when it is illuminated under normal incidence at an illumination wavelength ? through the substrate, the face of the layer opposite to the d substrate being in contact with a transparent so-called ambient medium whose refractive index n3 is less than that of the refractive index n0 of the substrate. Methods for producing a contrast-amplifying support and for observing a sample, or for detecting or assaying at least one chemical or biological species, using such a contrast-amplifying support are provided.

Abstract: A method for producing a contrast-amplifying support comprising an absorbing substrate carrying at least one absorbing layer comprises a design step for the support and the following steps: i) choosing an illumination wavelength ?; ii) choosing a material constituting the substrate and exhibiting, at illumination wavelength ?, a complex refractive index N0=n0?jk0 with k0?0.01; iii) choosing an ambient medium in contact with the layer on the side opposite to the substrate and exhibiting, at illumination wavelength ?, a complex refractive index N3=n3?jk3 with k3?0; iv) determining a nominal complex refractive index N1=n1?jk1 and a nominal thickness e1 of the layer wherein it behaves in the guise of antireflection layer when illuminated under normal incidence at illumination wavelength ?; and v) choosing a material constituting the layer and exhibiting, at illumination wavelength ?, a complex refractive index whose real and imaginary parts coincide with the nominal complex refractive index.

Abstract: The invention relates to a method for observing a sample under optical microscopy, in incoherent, unpolarised light, using a sample substrate including a contrast-amplifying layer having a complex index of refraction. The invention also relates to a method for detecting or metering at least one chemical or biological species using such a sample substrate.

Abstract: The invention relates to a method of analysing or observing an object (40) along an observation direction (?, ?), characterized in that:—a substantially monochromatic incident electromagnetic wave in the form of a polarized plane wave (E+) is directed towards the object,—an image of the object is captured, said image possibly being a point image, resulting from the electromagnetic wave (A(?, ?)) that may be specular, scattered or diffracted by at least one interface or a volume of the object illuminated by the incident wave, in the observation direction,—a retarder (43) with adjustable retardation and an analyser (44) whose orientation is adjustable are disposed in succession in the path of the wave (A(?, ?)), between an imaging sensor (45) and the object observed,—the retardation (??*(?, ?)) of the retarder and the orientation (?(?, ?)) of the analyser are adjusted so as to minimize—or even cancel—a part g(A) of the wave (A(?, ?)) filtered by the retarder and the analyser.