Abstract: The invention relates to an X-ray diffractometer device, comprising an X-ray source, a collimator device for the source, a sample support, a collimator device for the beam reflected by the sample and a counter producing an output signal in the form of a voltage which is proportional to the number of photons reflected by the sample. This device furthermore includes a motor drive for the sample support, recording means for the signal Y originating from the proportional counter as a function of the angle .theta. between the plane of incidence of the sample and the incident beam, denoted X, mechanical means having a support for a plurality of filters having different coefficients of absorption and including a motor drive for this filter support, data processing means for selecting one of the filters of the filter support and for controlling the motor drive of the sample support, the motor drive of the filter support and the recording means, respectively.

Abstract: Method of manufacturing orientated substrate plates from solid semiconductor blocks of the III-V group.The invention relates to a method of manufacturing to obtain substrate plates prepared to receive integrated semi-conductor circuits of materials of the III-V group obtained by pulling according to Czochralski. These materials having anisotropic properties, upon which the performances of the semiconductor devices depend, it is of major importance to differentiate the crystallographic axes of teach plate with an accuracy higher than half the degree. According to the invention, this differentiation is effected in two steps. The first step consists in the differentiation of the axes from the formation of pulling nucleus. For this purpose, the pulling nucleus is a rectangular parallelepipedon, one edge of which has a facet serving as a recess for fixing the seed crystal the pulling operation.

Abstract: Device for measuring the orientation of bulk monocrystalline materials with respect to the crystallographic parameters using the Laue method, consisting, on the one hand, of a Laue chamber including a polychromatic x-ray source, a photographic film support and a collimator placed in the path of the x-rays between the source and the film in the vicinity of the latter defining the optical axis of the Laue chamber, and consisting, on the other hand, of means of support for a bulk specimen, of means of alignment for the chamber and the means of support, and means of determining the orientation of the specimen with respect to the crystallographic axes, characterized in that the means of support comprise at least one specimen-carrier which has a first planar face to receive the specimen, a second planar space perpendicular to the first for immobilizing the specimen, a first reference plane parallel to the first planar face, a second reference face parallel to the second planar face and a third reference plane perpe

Abstract: A Laue camera is provided by incorporating an X-ray source represented by its focus and defined by its two focal dimensions and its exposure angle, a photographic film holder, a collimator taking the form of two diaphragms and placed on the path of the rays between the source and the film, but close to the latter. The X-ray source is used at an exposure angle such that its apparent focal dimensions are of the same size, that the diameter of the openings in the diaphragms is virtually of the same size as the two apparent focal dimensions of the source, that this size is smaller than the average radius desired for a spot in the diffraction diagram obtained from a sample obtained with the aid of this device with the sample being placed close to the surface of the film opposite to the source.