Abstract: In order to measure at least one geometric parameter of an eye, Purkinje reflections from blue and infrared light sources are recorded with a microscope and a camera. Due to the dispersion of the optics of the microscope, at least one set of reflections is defocused. By measuring the radii of the reflections, the offset of the camera from an ideal focusing position or another distance parameter can be calculated. The distance parameter can e.g. be used to correct the magnification factor of the microscope even if the microscope is a non-telecentric microscope. For example, it can be used to carry out more accurate keratometry measurement using a non-telecentric microscope and/or non-telecentric illumination.

Abstract: In the device and method, the angle of incidence of slit light onto an eye to be examined is determined from its Purkinje reflection recorded in an image by measuring the offset from the reflection to the apex of the image of the cornea. In another embodiment, Purkinje reflections of light sources arranged around the optical axis of the microscope are correlated with a reference pattern of radial stripes in order to determine the offset between the optical axis and the apex of the eye.

Abstract: A device (1) for examining an eye, in particular a slit lamp, comprises an image recording unit (220) with at least one first sensor (241.1) in a first beam path and a second sensor (241.2) in a second beam path, the device also comprising in the first beam path a first objective with a first optical axis, which has a fixed magnification and is arranged as fixed in the first beam path.

Abstract: The invention describes a method and a microscopy system for imaging and analyzing stochastically and independently blinking point-like emitters. A multiple-order cumulants analysis in conjunction with an established blinking model enables the extraction of super-resolved environment-related parameter maps, such as molecular state lifetimes, concentration and brightness distributions of the emitter. In addition, such parameter maps can be used to compensate for the non-linear brightness and blinking response of higher-order cumulant images—used for example in Super-resolution Optical Fluctuation Imaging (SOFI)—to generate a balanced image contrast. Structures that otherwise would be masked by brighter regions in the conventional cumulant image become samples using spectral cross-cumulants.

Abstract: The invention describes a method and a microscopy system for imaging and analysing stochastically and independently blinking point-like emitters. A multiple-order cumulants analysis in conjunction with an established blinking model enables the extraction of super-resolved environment-related parameter maps, such as molecular state lifetimes, concentration and brightness distributions of the emitter. In addition, such parameter maps can be used to compensate for the non-linear brightness and blinking response of higher-order cumulant images—used for example in Super-resolution Optical Fluctuation Imaging (SOFI)—to generate a balanced image contrast. Structures that otherwise would be masked by brighter regions in the conventional cumulant image become samples using spectral cross-cumulants.