Abstract: A radio frequency test and measurement device is provided. The radio frequency test and measurement device comprises a download unit, wherein the download unit is configured to download data from a server. In addition to this, the downloaded data comprises a predefined time limit and/or at least one use limit with respect to functionality of the radio frequency test and measurement device.

Abstract: The invention relates to a method for investigating signal parameters in an electrical measuring device with a display element with the method steps: display of a detected signal on the display element, manual masking of at least one signal component of the signal by a user by means of a masking element of the measuring device and investigation of signal parameters from the masked signal component or from the unmasked signal component of the signal by the measuring device. At least one further signal parameter is also investigated alongside the time duration and the bandwidth of the masked signal component. According to the invention, a corresponding measuring device is also provided.

Abstract: A measuring device for measuring a measurement signal of a device under test comprises a processing unit and a display unit. The processing unit comprises a detection unit configured to automatically determine at least one parameter characterizing the measurement signal. The processing unit further comprises a reconstruction unit configured to reconstruct an ideal measurement signal on the basis of the at least one parameter characterizing the measurement signal. The display unit is configured to display the measurement signal or a signal derived from the measurement signal and the reconstructed ideal measurement signal.

Abstract: The invention relates to a method for investigating signal parameters in an electrical measuring device with a display element with the method steps: display of a detected signal on the display element, manual masking of at least one signal component of the signal by a user by means of a masking element of the measuring device and investigation of signal parameters from the masked signal component or from the unmasked signal component of the signal by the measuring device. At least one further signal parameter is also investigated alongside the time duration and the bandwidth of the masked signal component. According to the invention, a corresponding measuring device is also provided.

Abstract: A measuring device for measuring a measurement signal of a device under test comprises a processing unit and a display unit. The processing unit comprises a detection unit configured to automatically determine at least one parameter characterizing the measurement signal. The processing unit further comprises a reconstruction unit configured to reconstruct an ideal measurement signal on the basis of the at least one parameter characterizing the measurement signal. The display unit is configured to display the measurement signal or a signal derived from the measurement signal and the reconstructed ideal measurement signal.