Patents by Inventor Clint Vandergiessen
Clint Vandergiessen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11486689Abstract: Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.Type: GrantFiled: February 4, 2020Date of Patent: November 1, 2022Assignee: DWFritz Automation, Inc.Inventors: Derek Aqui, Mark Baker, Chris Barns, Robert Batten, Shawn Boling, Jared Greco, Garrett Headrick, Clint Vandergiessen
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Publication number: 20220316851Abstract: Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.Type: ApplicationFiled: June 23, 2022Publication date: October 6, 2022Applicant: DWFritz Automation, Inc.Inventors: Derek Aqui, Mark Baker, Chris Barns, Robert Batten, Shawn Boling, Jared Greco, Garrett Headrick, Clint Vandergiessen
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Patent number: 10830618Abstract: Apparatuses, systems and methods associated with a trigger management device for managing triggering of sensors within measurement equipment are disclosed herein. In embodiments, a trigger management device may include trigger circuitry coupled to a sensor, the trigger circuitry to determine an amount of delay from trigger transmission to data capture for the sensor, and transmit a trigger to the sensor, the trigger to cause the sensor to capture sensor data. The trigger management device may further include encoder circuitry coupled to one or more encoders, the one or more encoders to indicate positions of one or more actuators or motors, the encoder circuitry to capture encoder data from the one or more encoders at a time that is the amount of delay after transmission of the trigger, wherein the encoder data indicates current positions of the one or more actuators or motors. Other embodiments may include circuitry to manage and/or transmit encoder and other data to multiple devices.Type: GrantFiled: February 28, 2019Date of Patent: November 10, 2020Assignee: DWFritz Automation, Inc.Inventors: Robert Batten, Mark Baker, Shawn Boling, John Fouts, Omar Mora, Clint Vandergiessen, Jared Greco
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Publication number: 20200209021Abstract: Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.Type: ApplicationFiled: February 4, 2020Publication date: July 2, 2020Applicant: DWFritz Automation, Inc.Inventors: Derek Aqui, Mark Baker, Chris Barns, Robert Batten, Shawn Boling, Jared Greco, Garrett Headrick, Clint Vandergiessen
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Patent number: 10598521Abstract: Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.Type: GrantFiled: February 28, 2019Date of Patent: March 24, 2020Assignee: DWFritz Automation, Inc.Inventors: Derek Aqui, Mark Baker, Chris Barns, Robert Batten, Shawn Boling, Jared Greco, Garrett Headrick, Clint Vandergiessen
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Publication number: 20190265081Abstract: Apparatuses, systems and methods associated with a trigger management device for managing triggering of sensors within measurement equipment are disclosed herein. In embodiments, a trigger management device may include trigger circuitry coupled to a sensor, the trigger circuitry to determine an amount of delay from trigger transmission to data capture for the sensor, and transmit a trigger to the sensor, the trigger to cause the sensor to capture sensor data. The trigger management device may further include encoder circuitry coupled to one or more encoders, the one or more encoders to indicate positions of one or more actuators or motors, the encoder circuitry to capture encoder data from the one or more encoders at a time that is the amount of delay after transmission of the trigger, wherein the encoder data indicates current positions of the one or more actuators or motors. Other embodiments may include circuitry to manage and/or transmit encoder and other data to multiple devices.Type: ApplicationFiled: February 28, 2019Publication date: August 29, 2019Applicant: DWFritz Automation, Inc.Inventors: Robert Batten, Mark Baker, Shawn Boling, John Fouts, Omar Mora, Clint Vandergiessen, Jared Greco
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Patent number: 8497450Abstract: A laser-based workpiece processing system includes sensors connected to a sensor controller that converts sensor signals into focused spot motion commands for actuating a beam steering device, such as a two-axis steering mirror. The sensors may include a beam position sensor for correcting errors detected in the optical path, such as thermally-induced beam wandering in response to laser or acousto-optic modulator pointing stability, or optical mount dynamics.Type: GrantFiled: October 26, 2007Date of Patent: July 30, 2013Assignee: Electro Scientific Industries, Inc.Inventors: Kelly Bruland, Mark Unrath, Stephen Swaringen, Ho Wai Lo, Clint Vandergiessen, Keith Grant
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Patent number: 8383982Abstract: Methods and systems selectively irradiate structures on or within a semiconductor substrate using multiple laser beams. The structures may be laser-severable conductive links, and the purpose of the irradiation may be to sever selected links.Type: GrantFiled: October 30, 2007Date of Patent: February 26, 2013Assignee: Electro Scientific Industries, Inc.Inventors: Kelly J. Bruland, Stephen N. Swaringen, Brian W. Baird, Ho Wai Lo, David Martin Hemenway, Brady Nilsen, Clint Vandergiessen
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Patent number: 8278595Abstract: A predictive pulse triggering (PPT) method enables precise triggering of a laser beam in a link-processing system. The PPT method entails triggering the laser beam based on estimated relative motion parameters of the target and laser beam axis. The PPT method allows for a six-fold improvement in laser positioning accuracy over the conventional, entirely measurement-based method.Type: GrantFiled: March 16, 2007Date of Patent: October 2, 2012Assignee: Electro Scientific Industries, Inc.Inventors: Kelly Bruland, Clint Vandergiessen
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Patent number: 8238007Abstract: A laser-based workpiece processing system includes sensors connected to a sensor controller that converts sensor signals into focused spot motion commands for actuating a beam steering device, such as a two-axis steering mirror. The sensors may include a beam position sensor for correcting errors detected in the optical path, such as thermally-induced beam wandering in response to laser or acousto-optic modulator pointing stability, or optical mount dynamics.Type: GrantFiled: December 26, 2006Date of Patent: August 7, 2012Assignee: Electro Scientific Industries, Inc.Inventors: Kelly Bruland, Mark Unrath, Stephen Swaringen, Ho Wai Lo, Clint Vandergiessen, Keith Grant
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Patent number: 8076605Abstract: Systems and methods automatically modify a laser-based system for processing target specimens such as semiconductor wafers. In one embodiment, the laser-based system detects a trigger associated with a processing model. The processing model corresponds to a set of wafers. In response to the trigger, the system automatically adjusts one or more system parameters based on the processing model. The system then uses the modified system parameters to selectively irradiate structures on or within at least one wafer in the set of wafers. In one embodiment, the trigger includes variations in a thermal state related to a motion stage. In response to the variations in the thermal state, the system operates the motion stage in a series of movements until a thermal equilibrium threshold is reached. The sequence of movements may, for example, simulate movements used to process a particular wafer.Type: GrantFiled: June 25, 2007Date of Patent: December 13, 2011Assignee: Electro Scientific Industries, Inc.Inventors: Kelly J. Bruland, Clint Vandergiessen, Duane Eitzen
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Patent number: 7982160Abstract: Processing a workpiece with a laser includes generating laser pulses at a first pulse repetition frequency. The first pulse repetition frequency provides reference timing for coordination of a beam positioning system and one or more cooperating beam position compensation elements to align beam delivery coordinates relative to the workpiece. The method also includes, at a second pulse repetition frequency that is lower than the first pulse repetition frequency, selectively amplifying a subset of the laser pulses. The selection of the laser pulses included in the subset is based on the first pulse repetition frequency and position data received from the beam positioning system. The method further includes adjusting the beam delivery coordinates using the one or more cooperating beam position compensation elements so as to direct the amplified laser pulses to selected targets on the workpiece.Type: GrantFiled: March 31, 2008Date of Patent: July 19, 2011Assignee: Electro Scientific Industries, Inc.Inventors: Brian W. Baird, Kelly J. Bruland, Clint Vandergiessen, Mark A. Unrath, Brady Nilsen, Steve Swaringen
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Publication number: 20080314879Abstract: Systems and methods automatically modify a laser-based system for processing target specimens such as semiconductor wafers. In one embodiment, the laser-based system detects a trigger associated with a processing model. The processing model corresponds to a set of wafers. In response to the trigger, the system automatically adjusts one or more system parameters based on the processing model. The system then uses the modified system parameters to selectively irradiate structures on or within at least one wafer in the set of wafers. In one embodiment, the trigger includes variations in a thermal state related to a motion stage. In response to the variations in the thermal state, the system operates the motion stage in a series of movements until a thermal equilibrium threshold is reached. The sequence of movements may, for example, simulate movements used to process a particular wafer.Type: ApplicationFiled: June 25, 2007Publication date: December 25, 2008Applicant: Electro Scientific Industries, Inc.Inventors: Kelly J. Bruland, Clint Vandergiessen, Duane Eitzen
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Publication number: 20080223837Abstract: A predictive pulse triggering (PPT) method enables precise triggering of a laser beam in a link-processing system. The PPT method entails triggering the laser beam based on estimated relative motion parameters of the target and laser beam axis. The PPT method allows for a six-fold improvement in laser positioning accuracy over the conventional, entirely measurement-based method.Type: ApplicationFiled: March 16, 2007Publication date: September 18, 2008Applicant: Electro Scientific Industries, Inc.Inventors: Kelly Bruland, Clint Vandergiessen
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Publication number: 20080093349Abstract: A laser-based workpiece processing system includes sensors connected to a sensor controller that converts sensor signals into focused spot motion commands for actuating a beam steering device, such as a two-axis steering mirror. The sensors may include a beam position sensor for correcting errors detected in the optical path, such as thermally-induced beam wandering in response to laser or acousto-optic modulator pointing stability, or optical mount dynamics.Type: ApplicationFiled: October 26, 2007Publication date: April 24, 2008Applicant: Electro Scientific Industries, Inc.Inventors: Kelly Bruland, Mark Unrath, Stephen Swaringen, Ho Lo, Clint Vandergiessen, Keith Grant
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Publication number: 20080017618Abstract: A laser-based workpiece processing system includes sensors connected to a sensor controller that converts sensor signals into focused spot motion commands for actuating a beam steering device, such as a two-axis steering mirror. The sensors may include a beam position sensor for correcting errors detected in the optical path, such as thermally-induced beam wandering in response to laser or acousto-optic modulator pointing stability, or optical mount dynamics.Type: ApplicationFiled: December 26, 2006Publication date: January 24, 2008Inventors: Kelly Bruland, Clint Vandergiessen, Keith Grant, Stephen Swaringen
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Patent number: 7245412Abstract: A laser-based workpiece processing system includes sensors connected to a sensor controller that converts sensor signals into focused spot motion commands for actuating a beam steering device, such as a two-axis steering mirror. The sensors may include a beam position sensor for correcting errors detected in the optical path, such as thermally-induced beam wandering in response to laser or acousto-optic modulator pointing stability, or optical mount dynamics.Type: GrantFiled: November 9, 2004Date of Patent: July 17, 2007Assignee: Electro Scientific Industries, Inc.Inventors: Kelly Bruland, Clint Vandergiessen, Keith Grant, Stephen Swaringen
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Publication number: 20050254109Abstract: A laser-based workpiece processing system includes sensors connected to a sensor controller that converts sensor signals into focused spot motion commands for actuating a beam steering device, such as a two-axis steering mirror. The sensors may include a beam position sensor for correcting errors detected in the optical path, such as thermally-induced beam wandering in response to laser or acousto-optic modulator pointing stability, or optical mount dynamics.Type: ApplicationFiled: November 9, 2004Publication date: November 17, 2005Applicant: Electro Scientific Industries, Inc.Inventors: Kelly Bruland, Clint Vandergiessen, Keith Grant, Stephen Swaringen