Abstract: System and method are disclosed for inspecting objects, such as sheets of flat panel glass, to detect flaws or contamination at a surface. The surface to be inspected is illuminated with 253.7 nm ultraviolet (UV) radiation to assure detection of defects only at the front surface subjected to the radiation. UV radiation reaching the front surface is scattered by defects at the front surface, and scattered UV radiation is collected by a UV dark field imaging system and directed by the imaging system to a detecting unit, preferably including a charge coupled device (CCD). The detecting unit senses UV radiation scattered at the surface due to defects within a selected size range and provides an output to a processing unit providing an output indicative of the defects sensed within the selected size range.