Patents by Inventor Clive Catterall

Clive Catterall has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • APPARATUS FOR CHARACTERIZING PARTICLES AND METHOD FOR USE IN CHARACTERIZING PARTICLES
    Publication number: 20240393221
    Abstract: A particle characterization apparatus is disclosed comprising: a first light source; a second light source, a sample cell; a first detector and a second detector. The first light source is operable to illuminate a first region of a sample comprising dispersed particles within the sample cell with a first light beam along a first light beam axis so as to produce scattered light by interactions of the first light beam with the sample. The first detector is configured to detect the scattered light. The second light source is operable to illuminate a second region of the sample with a second light beam along a second light beam axis. The second detector is an imaging detector, configured to image the particles along an imaging axis using the second light beam. The first light beam axis is at an angle of at least 5 degrees to the second light beam axis.
    Type: Application
    Filed: July 6, 2023
    Publication date: November 28, 2024
    Applicant: Malvern Panalytical Limited
    Inventors: David SPRIGGS, Clive CATTERALL
  • Apparatus for characterizing particles and method for use in characterizing particles
    Patent number: RE49651
    Abstract: A particle characterization apparatus is disclosed comprising: a first light source; a second light source, a sample cell; a first detector and a second detector. The first light source is operable to illuminate a first region of a sample comprising dispersed particles within the sample cell with a first light beam along a first light beam axis so as to produce scattered light by interactions of the first light beam with the sample. The first detector is configured to detect the scattered light. The second light source is operable to illuminate a second region of the sample with a second light beam along a second light beam axis. The second detector is an imaging detector, configured to image the particles along an imaging axis using the second light beam. The first light beam axis is at an angle of at least 5 degrees to the second light beam axis.
    Type: Grant
    Filed: December 11, 2018
    Date of Patent: September 12, 2023
    Assignee: Malvern Panalytical Limited
    Inventors: David Spriggs, Clive Catterall