Abstract: Displays, systems, and methods may be utilized in applications including, but not limited to, projectors, head-up displays, and augmented reality (AR), mixed reality (MR), and virtual reality (VR) systems or devices, such as headsets or other near-eye devices or systems. Tiled or Tile-able displays and methods, in accordance with the present invention, provide displays of varying sizes, and as such, a Tiled or Tile-able display is configured to accommodate the display size needed for various wearable and mobile devices that require or incorporate displays.

Abstract: Displays, systems, and methods may be utilized in applications including, but not limited to, projectors, head-up displays, and augmented reality (AR), mixed reality (MR), and virtual reality (VR) systems or devices, such as headsets or other near-eye devices or systems. Tiled or Tile-able displays and methods, in accordance with the present invention, provide displays of varying sizes, and as such, a Tiled or Tile-able display is configured to accommodate the display size needed for various wearable and mobile devices that require or incorporate displays.

Abstract: Displays, systems, and methods may be utilized in applications including, but not limited to, projectors, head-up displays, and augmented reality (AR), mixed reality (MR), and virtual reality (VR) systems or devices, such as headsets or other near-eye devices or systems. Tiled or Tile-able displays and methods, in accordance with the present invention, provide displays of varying sizes, and as such, a Tiled or Tile-able display is configured to accommodate the display size needed for various wearable and mobile devices that require or incorporate displays.

Abstract: Displays, systems, and methods may be utilized in applications including, but not limited to, projectors, head-up displays, and augmented reality (AR), mixed reality (MR), and virtual reality (VR) systems or devices, such as headsets or other near-eye devices or systems. Tiled or Tile-able displays and methods, in accordance with the present invention, provide displays of varying sizes, and as such, a Tiled or Tile-able display is configured to accommodate the display size needed for various wearable and mobile devices that require or incorporate displays.

Abstract: Displays, systems, and methods may be utilized in applications including, but not limited to, projectors, head-up displays, and augmented reality (AR), mixed reality (MR), and virtual reality (VR) systems or devices, such as headsets or other near-eye devices or systems. Tiled or Tile-able displays and methods, in accordance with the present invention, provide displays of varying sizes, and as such, a Tiled or Tile-able display is configured to accommodate the display size needed for various wearable and mobile devices that require or incorporate displays.

Abstract: Displays, systems, and methods may be utilized in applications including, but not limited to, projectors, head-up displays, and augmented reality (AR), mixed reality (MR), and virtual reality (VR) systems or devices, such as headsets or other near-eye devices or systems. Tiled or Tile-able displays and methods, in accordance with the present invention, provide displays of varying sizes, and as such, a Tiled or Tile-able display is configured to accommodate the display size needed for various wearable and mobile devices that require or incorporate displays.

Abstract: An integrated circuit test structure comprises a potential divider and an array of test circuits. Each test circuit comprises series-connected chains of integrated circuit connections between test voltage lines. Each test circuit also comprises a comparator in the form of a MOSFET having a gate connected to the center point of the chains and a source connected to the output of the potential divider. The drain of the transistor is connected to an input for a bias voltage.

Abstract: A test structure is provided for allowing a parametric test system, for example towards the end of a production line at a foundry, to measure the junction leakage of a semiconductor device such as an integrated circuit. The structure is formed as part of the device and comprises a MOSFET whose source and drain are provided with connections which are accessible to the tester for biasing the device and measuring the drain current. A capacitor is connected between the gate of the MOSFET and another connection allowing the tester to supply various voltages to the connection. A junction diode is connected between the gate and body terminal of the MOSFET. During testing, the parametric tester supplies a voltage to allow the capacitor 1 to be charged via the forward-biased diode. The tester then supplies another voltage such that the diode becomes reverse-biased and its leakage current discharges the capacitor so that the voltage on the gate of the MOSFET falls.

Abstract: An integrated circuit test structure comprises a potential divider and an array of test circuits. Each test circuit comprises series-connected chains of integrated circuit connections between test voltage lines. Each test circuit also comprises a comparator in the form of a MOSFET having a gate connected to the center point of the chains and a source connected to the output of the potential divider. The drain of the transistor is connected to an input for a bias voltage.