Patents by Inventor Colin August Sanford
Colin August Sanford has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9865427Abstract: A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.Type: GrantFiled: May 5, 2015Date of Patent: January 9, 2018Assignee: FEI CompanyInventors: Martinus Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W. G. Persoon
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Publication number: 20150332891Abstract: A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.Type: ApplicationFiled: May 5, 2015Publication date: November 19, 2015Applicant: FEI COMPANYInventors: MART PETRUS MARIA BIERHOFF, BART BUIJSSE, CORNELIS SANDER KOOIJMAN, HUGO VAN LEEUWEN, HENDRIK GEZINUS TAPPEL, COLIN AUGUST SANFORD, SANDER RICHARD MARIE STOKS, STEVEN BERGER, BEN JACOBUS MARIE BORMANS, KOEN ARNOLDUS WILHELMUS DRIESSEN, JOHANNES ANTONIUS HENDRICUS W. G. PERSOON
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Patent number: 9025018Abstract: A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.Type: GrantFiled: June 7, 2007Date of Patent: May 5, 2015Assignee: FEI CompanyInventors: Martinus Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W.G. Persoon
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Patent number: 8399864Abstract: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.Type: GrantFiled: August 31, 2011Date of Patent: March 19, 2013Assignee: FEI CompanyInventors: Raymond Hill, Lawrence Scipioni, Colin August Sanford, Mark DiManna, Michael Tanguay
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Patent number: 8309921Abstract: A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder.Type: GrantFiled: February 1, 2011Date of Patent: November 13, 2012Assignee: FEI CompanyInventors: Martinus Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W. G. Persoon
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Publication number: 20110309263Abstract: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.Type: ApplicationFiled: August 31, 2011Publication date: December 22, 2011Applicant: FEI COMPANYInventors: Raymond Hill, Colin August Sanford, Lawrence Scipioni, Mark DiManna, Michael Tanguay
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Patent number: 8013311Abstract: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.Type: GrantFiled: October 9, 2009Date of Patent: September 6, 2011Assignee: FEI CompanyInventors: Raymond Hill, Lawrence Scipioni, Colin August Sanford, Mark DiManna, Michael Tanguay
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Publication number: 20110133083Abstract: A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder.Type: ApplicationFiled: February 1, 2011Publication date: June 9, 2011Applicant: FEI COMPANYInventors: MART PETRUS MARIA BIERHOFF, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Ben Jacobus Marie Bormans, Steven Berger, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus WILHELMUS Gerardus Persoon
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Patent number: 7917349Abstract: An improved simulator for an analytical instrument that provides the student with an experience similar to that of operating the actual instrument. In one preferred embodiment, the invention combines real functionality and simulated functionality where at least one function of the analytical instrument is real. In another preferred embodiment, the invention combines a functional first instrument along with a simulation of a second instrument, the simulation including both hardware with limited functionality and software that simulates the output of a functional instrument to create a teaching aid for use in classrooms and teaching laboratories.Type: GrantFiled: June 17, 2006Date of Patent: March 29, 2011Assignee: FEI CompanyInventors: Steven Berger, Colin August Sanford
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Patent number: 7906762Abstract: A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder.Type: GrantFiled: June 7, 2007Date of Patent: March 15, 2011Assignee: FEI CompanyInventors: Mart Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Ben Jacobus Marie Bormans, Steven Berger, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus Wilhelmus Gerardus Persoon
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Publication number: 20100230590Abstract: A compact electron microscope is robust, simple to operate, and preferably requires no special utilities. Imaging can begin shortly after a sample is inserted. A preferred simplified design includes permanent magnets for focusing, lack a vacuum controller and vacuum gauge, and uses a backscattered electron detector and no secondary electron detector.Type: ApplicationFiled: June 7, 2007Publication date: September 16, 2010Applicant: FEI COMPANYInventors: Mart Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W. G. Persoon
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Publication number: 20100194874Abstract: A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.Type: ApplicationFiled: June 7, 2007Publication date: August 5, 2010Applicant: FEI COMPANYInventors: Mart Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooljman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stocks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W.G. Persoon
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Publication number: 20100171037Abstract: A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder.Type: ApplicationFiled: June 7, 2007Publication date: July 8, 2010Applicant: FEI COMPANYInventors: Mart Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W. G. Persoon
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Publication number: 20100025578Abstract: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.Type: ApplicationFiled: October 9, 2009Publication date: February 4, 2010Applicant: FEI COMPANYInventors: Raymond Hill, Colin August Sanford, Lawrence Scipioni, Mark DiManna, Michael Tanguay
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Patent number: 7601976Abstract: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.Type: GrantFiled: December 18, 2006Date of Patent: October 13, 2009Assignee: FEI CompanyInventors: Raymond Hill, Colin August Sanford, Lawrence Scipioni, Mark DiManna, Michael Tanguay
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Patent number: 7161159Abstract: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.Type: GrantFiled: July 13, 2004Date of Patent: January 9, 2007Assignee: FEI CompanyInventors: Raymond Hill, Colin August Sanford, Lawrence Scipioni, Mark DiManna, Michael Tanguay
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Patent number: 6852982Abstract: In one embodiment of the present invention, a magnetic lens is provided that can generate a substantially constant amount of average heat power over a pre-selected range of resultant magnetic field strengths. The lens is configured to do this with multiple, asymmetric (different turns) coil sections that can produce a desired range of field strengths, and at the same time, maintain a sufficiently constant temperature signature when the average total power is maintained constant thereby eliminating unreasonable delays in lens operation when the resultant field strength is changed. The asymmetric lens structure allows for the smaller coil to be made with less relative inductance thereby making it more responsive and amenable for an AC drive signal and thus dynamic focusing applications if desired.Type: GrantFiled: July 14, 2003Date of Patent: February 8, 2005Assignee: FEI CompanyInventors: Martinus Petrus Maria Bierhoff, Cornelis Sander Kees Kooijman, Colin August Sanford