Patents by Inventor Colin Eberhardt

Colin Eberhardt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fast multi-line laser confocal scanning microscope
    Patent number: 7221503
    Abstract: According to a first embodiment the invention provides, for achieving fast multi-wavelength scanning in an acousto-optical deflector based confocal scanning microscope, dynamically adjusting an optical path of said an acousto-optical deflector based confocal microscope by mechanical means in accordance with a selected wavelength of a laser light beam, to compensate for astigmatism and collimation changes due to the change in input beam wavelength and modifying detected images of an object by electronic means to maintain alignment of the scan lines of the image at all wavelengths. According to a second embodiment the invention provides, for achieving fast multi-wavelength scanning in an acousto-optical deflector based laser confocal scanning microscope, dynamically adjusting drive parameters of the acousto-optical deflector in accordance with the selected wavelength of the input laser light beams, to maintain alignment of the scan lines of the image at all wavelengths.
    Type: Grant
    Filed: April 8, 2004
    Date of Patent: May 22, 2007
    Assignee: VisiTech International, Ltd.
    Inventors: Colin Eberhardt, Jafer Sheblee, Ken Bell
  • Fast Multi-line laser confocal scanning microscope
    Publication number: 20050225850
    Abstract: According to a first embodiment the invention provides, for achieving fast multi-wavelength scanning in an acousto-optical deflector based confocal scanning microscope, dynamically adjusting an optical path of said an acousto-optical deflector based confocal microscope by mechanical means in accordance with a selected wavelength of a laser light beam, to compensate for astigmatism and collimation changes due to the change in input beam wavelength and modifying detected images of an object by electronic means to maintain alignment of the scan lines of the image at all wavelengths. According to a second embodiment the invention provides, for achieving fast multi-wavelength scanning in an acousto-optical deflector based laser confocal scanning microscope, dynamically adjusting drive parameters of the acousto-optical deflector in accordance with the selected wavelength of the input laser light beams, to maintain alignment of the scan lines of the image at all wavelengths.
    Type: Application
    Filed: April 8, 2004
    Publication date: October 13, 2005
    Inventors: Colin Eberhardt, Jafer Sheblee, Ken Bell