Abstract: A method for operating a point laser-scanning microscope includes scanning a sample with a focused illumination laser beam; recording a plurality of images by detecting elements being configurable to an intensity mode, in which the recorded images are intensity images gi,j(n) related to photons collected during an entire dwell time of the illumination beam on an individual position n, or to a time-resolved mode, in which the recorded images are time-resolved images gi,jt(n, t), the collected photons being discriminated based on their arrival times to individual detecting elements; calculating a fingerprint image a by summing the plurality of intensity images gi,j(n) over all positions n; estimating shift matrices sx and sy from the intensity images gi,j(n); reconstructing at least one of a time-resolved object function ft and an intensity object function f; and visualizing at least one of a high-resolution time-resolved image ft˜ and a high-resolution intensity image f˜.

Abstract: A method for operating a point laser-scanning microscope comprises scanning a sample with a focused illumination laser beam; recording a plurality of images by detecting elements being configurable to an intensity mode, in which the recorded images are intensity images gi,j(n) related to photons collected during an entire dwell time of the illumination laser beam on an individual position n, or to a time-resolved mode, in which the recorded images are time-resolved images gi,jt(n,t), the collected photons being discriminated based on their arrival times to individual detecting elements; calculating a fingerprint image a by summing the plurality of intensity images gi,j(n) over all positions n; estimating shift matrices sx and sy from the intensity images gi,j(n); reconstructing at least one of a time-resolved object function ft and an intensity object function f; and visualizing at least one of a high-resolution time-resolved image ft˜ and a high-resolution intensity image f˜.

Abstract: An imaging system is provided that includes a pulsed light source providing pulsed light and is applicable to both microscopes and endoscopes. One or more optical elements with certain dispersive properties are positioned to receive the pulsed light and apply selective dispersive properties to shift the focal plane according to the user and to produce two photon (2p) wide field uniform illumination and 2p wide field structured illumination for the purpose of improving the optical axial resolution and rejection of background signal. An imaging element receives the signal arising from the 2p wide field uniform illumination and 2p wide field structured illumination and produces a respective 3D resolved image of a sample.

Abstract: An imaging system is provided that includes a pulsed light source providing pulsed light and is applicable to both microscopes and endoscopes. One or more optical elements with certain dispersive properties are positioned to receive the pulsed light and apply selective dispersive properties to shift the focal plane according to the user and to produce two photon (2p) wide field uniform illumination and 2p wide field structured illumination for the purpose of improving the optical axial resolution and rejection of background signal. An imaging element receives the signal arising from the 2p wide field uniform illumination and 2p wide field structured illumination and produces a respective 3D resolved image of a sample.

Abstract: A scanning microscope includes first and second focusing means arranged confocally, at least one focusing means being of annular form, (for example a lens and closely-spaced opaque screen having an annular aperture); coherent radiation detection means arranged to receive radiation from one focusing means; and scanning means to scan an object in the focal plane.