Abstract: One embodiment of a method for calibrating a test color measurement device in conjunction with an emissive display includes measuring spectral sensitivities of at least four channels of a more-than-three-channel sensor in the test color measurement device, linearly regressing the spectral sensitivities to a least-square best fit to Commission International de l'Éclairage (CIE) color matching functions, wherein the linearly regressing is performed using a weighting function that is based on a square root of a spectral power distribution characteristic of the emissive display or of a type of the emissive display, and computing a set of initial fitting coefficient values from the linearly regressing.

Abstract: One embodiment of a method for calibrating a test color measurement device in conjunction with an emissive display includes measuring initial spectral sensitivities of at least four channels of the test color measurement device, linearly regressing the spectral sensitivities to a least-square best fit to CIE color matching functions, measuring CIE tristimulus values of test colors on the display using a reference color measurement device, measuring the CIE tristimulus values on the display using the test color measurement device, transforming the CIE tristimulus values measured by the test color measurement device to CIE tristimulus values that would have been measured by the reference color measurement device, using a nonlinear function with variable fitting coefficients, and storing initial fitting coefficient values that provide a least-square best fit of the CIE tristimulus values measured by the test color measurement device and the CIE tristimulus values measured by the reference color measurement devic

Abstract: One embodiment of a method for calibrating a test color measurement device in conjunction with an emissive display includes measuring spectral sensitivities of at least four channels of a more-than-three-channel sensor in the test color measurement device, linearly regressing the spectral sensitivities to a least-square best fit to Commission International de l'Éclairage (CIE) color matching functions, wherein the linearly regressing is performed using a weighting function that is based on a square root of a spectral power distribution characteristic of the emissive display or of a type of the emissive display, and computing a set of initial fitting coefficient values from the linearly regressing.

Abstract: One embodiment of a solid-state color-measuring device includes a plurality of photodetectors and a plurality of filters permanently deposited on the photodetectors, where at least one of the filters includes a single colorant layer having a transmission coefficient as a function of wavelength that descends from a maximum value between approximately 445 and 450 nm to fifteen percent of the maximum value between approximately 485 and 495 nm.

Abstract: A tristimulus colorimeter on a single semiconductor chip having at least three detectors, each detector being coated by colorant filters, each filter having at least one layer and at least one filter having a double layer is provided. The colorimeter determines CIE tristimulus values of an incident light from inputs to the filters and detectors. Colorimeters having integral dye filters may be constructed on a single silicon chip embodying all the detectors and electronics, coated over each detector by a deposited filter layer. Colorants may be directly deposited on the detectors, rather than using a plastic substrate for a filter.

Abstract: A method for determining the optimal colorant thicknesses and linear combinations for integral illuminant-weighted CIE color-matching filters is provided. A reflectance colorimeter for configuring printers may be designed using this method.

Abstract: One embodiment of a method for calibrating a test color measurement device in conjunction with an emissive display includes measuring initial spectral sensitivities of at least four channels of the test color measurement device, linearly regressing the spectral sensitivities to a least-square best fit to CIE color matching functions, measuring CIE tristimulus values of test colors on the display using a reference color measurement device, measuring the CIE tristimulus values on the display using the test color measurement device, transforming the CIE tristimulus values measured by the test color measurement device to CIE tristimulus values that would have been measured by the reference color measurement device, using a nonlinear function with variable fitting coefficients, and storing initial fitting coefficient values that provide a least-square best fit of the CIE tristimulus values measured by the test color measurement device and the CIE tristimulus values measured by the reference color measurement devic

Abstract: A tristimulus colorimeter for measuring reflective or transmissive materials is provided. The colorimeter measures a sample under a calibrated light source, receives inputs to detectors, and determines CIE tristimulus values of the same sample as they would occur under a reference light source. The colorimeter includes a calibrated light source and a single silicon chip that includes three or more detectors. Each detector is permanently coated by a different mix of dyes or other colorants that form a wavelength-selective filter. A single silicon chip embodies all the detectors and electronics, with each detector coated over by deposited filter layers.

Abstract: A method for determining the optimal colorant thicknesses for integral CIE color-matching filters is provided. According to a computational study, a four band filter of the present invention provides a best approximation to the CIE XYZ color-matching functions with the least cost.

Abstract: A tristimulus colorimeter for measuring reflective or transmissive materials is provided. The colorimeter measures a sample under a calibrated light source, receives inputs to detectors, and determines CIE tristimulus values of the same sample as they would occur under a reference light source. The colorimeter includes a calibrated light source and a single silicon chip that includes three or more detectors. Each detector is permanently coated by a different mix of dyes or other colorants that form a wavelength-selective filter. A single silicon chip embodies all the detectors and electronics, with each detector coated over by deposited filter layers.

Abstract: A method for determining the optimal colorant thicknesses and linear combinations for integral illuminant-weighted CIE color-matching filters is provided. A reflectance colorimeter for configuring printers may be designed using this method.

Abstract: A tristimulus colorimeter on a single semiconductor chip having at least three detectors, each detector being coated by colorant filters, each filter having at least one layer and at least one filter having a double layer is provided. The colorimeter determines CIE tristimulus values of an incident light from inputs to the filters and detectors. Colorimeters having integral dye filters may be constructed on a single silicon chip embodying all the detectors and electronics, coated over each detector by a deposited filter layer. Colorants may be directly deposited on the detectors, rather than using a plastic substrate for a filter.

Abstract: A method for determining the optimal colorant thicknesses for integral CIE color-matching filters is provided. According to a computational study, a four band filter of the present invention provides a best approximation to the CIE XYZ color-matching functions with the least cost.