Patents by Inventor Conrado Blasco

Conrado Blasco has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070033383
    Abstract: A method and a data processing apparatus operable to process instructions from a plurality of instruction sets, the plurality of instruction sets each sharing a sub-set of common instructions and each having a remaining set of instructions is disclosed. The data processing apparatus comprises: a plurality of decode units, each decode unit being operable to only decode the remaining set of instructions from a corresponding one of the plurality of instruction sets; and a common decode unit operable to decode a number of the sub-set of common instructions from each of the plurality of instruction sets. This enables the common instructions from each instruction set to be decoded by the common decode unit. Hence, the logic which would otherwise be duplicated in each of the individual decode units for each instruction set can be removed from those decode units and provided just once in the common decode unit.
    Type: Application
    Filed: August 5, 2005
    Publication date: February 8, 2007
    Applicant: ARM Limited
    Inventors: Conrado Blasco Allue, Glen Harris, Stephen Hill
  • Publication number: 20060218449
    Abstract: A data processing apparatus is operable in a either a self-test mode or an operational mode. The apparatus comprises a plurality of functional units, at least one of the functional units being operable to perform data processing operations and at least a subset of the plurality of functional units having at least one of a respective co-processor register for storing configuration data, a respective debug register for storing debug data and a respective functional unit memory. A memory self-test controller operable in the self-test mode to output self-test data for performing access operations to confirm correct operation of the functional unit memory. A debug controller outputs debug data and co-ordinates debug operations, the debug controller being one of the plurality of functional units.
    Type: Application
    Filed: March 22, 2005
    Publication date: September 28, 2006
    Applicant: ARM Limited
    Inventors: Conrado Blasco Allue, Stephen Hill, Richard Slobodnik
  • Publication number: 20060200653
    Abstract: Within a multiple instruction pipeline data processing system which supports predication instructions, program instructions are initially decoded upon the assumption that they are predicated. A predication signal is generated within the instruction decoder stages when a predication instruction is detected. The presence or absence of this predication signal can then be used to correct any decoding which has been performed upon the basis of an assumption that the program instructions are predicated. The predication instruction can predicate a variable number of following instructions. The predication instruction can issue in parallel with an instruction which it predicates and yet the proper identification of the predication instruction need not be confirmed until at least some decoding has been performed upon the other program instruction.
    Type: Application
    Filed: March 7, 2005
    Publication date: September 7, 2006
    Applicant: ARM Limited
    Inventors: Conrado Blasco Allue, Glen Harris, Stephen Hill
  • Patent number: 7020768
    Abstract: The present invention provides an apparatus and method for facilitating debugging of sequences of processing instructions. The apparatus comprises a processing circuit for executing processing instructions, the processing circuit having multiple states of operation, with each state of operation being assigned a context identifier to identify the state of operation. Further, logic is provided for facilitating debugging of sequences of processing instructions executed by the processing circuit. The logic comprises control logic, responsive to control parameters, to perform predetermined actions to facilitate debugging, and triggering logic for generating the control parameters dependent on data received from the processing circuit indicative of the processing being performed by the processing circuit.
    Type: Grant
    Filed: February 26, 2001
    Date of Patent: March 28, 2006
    Assignee: ARM Limited
    Inventors: Andrew Brookfield Swaine, Conrado Blasco Allué, Ian Victor Devereux, David James Williamson, Anthony Neil Berent
  • Publication number: 20050246585
    Abstract: A data processing system 2 is described having a central processing unit 4 and a diagnostic mechanism 10. The central processing unit 4 is switchable into a power-down mode from which it may resume into a normal operation mode. When the central processing unit 4 resumes into the normal operation mode, execution of program instructions is inhibited by the diagnostic mechanism 10 to allow the diagnostic mechanism to be appropriately programmed such that the immediate power-up code and operations can be properly diagnosed. The requirement to prevent program instruction execution on power-up is programmed by writing to a latch 16 within the diagnostic mechanism 10 prior to the power-down. The prevention of program execution may be achieved, for example, by generation of a halt request or by extending the time period for which the central processing unit 4 is held in reset following power-up.
    Type: Application
    Filed: March 22, 2005
    Publication date: November 3, 2005
    Applicant: ARM Limited
    Inventors: Conrado Blasco Allue, Paul Kimelman, Andrew Swaine, Richard Grisenthwaite
  • Patent number: 6691270
    Abstract: The present invention provides a technique for operating an integrated circuit comprising a plurality of circuit elements, with a plurality of serial test scan chains, each being coupled to a different one of the circuit elements. A scan chain selector is responsive to a specified scan chain specifying value to select a corresponding one of the plurality of test scan chains. A scan chain controller is also provided which has a serial interface for receiving signals from outside of the integrated circuit, the scan chain controller comprising an instruction decoder for decoding scan chain controller instructions received from the serial interface. In accordance with the present invention, the decoder is responsive to a first scan chain controller instruction to specify a pre-determined scan chain specifying value and a second scan chain controller instruction for decoding by the decoder.
    Type: Grant
    Filed: December 22, 2000
    Date of Patent: February 10, 2004
    Assignee: ARM Limited
    Inventors: Conrado Blasco Allué, Ian Victor Devereux
  • Publication number: 20020184477
    Abstract: The present invention provides an apparatus and method for facilitating debugging of sequences of processing instructions. The apparatus comprises a processing circuit for executing processing instructions, the processing circuit having multiple states of operation, with each state of operation being assigned a context identifier to identify the state of operation. Further, logic is provided for facilitating debugging of sequences of processing instructions executed by the processing circuit. The logic comprises control logic, responsive to control parameters, to perform predetermined actions to facilitate debugging, and triggering logic for generating the control parameters dependent on data received from the processing circuit indicative of the processing being performed by the processing circuit.
    Type: Application
    Filed: February 26, 2001
    Publication date: December 5, 2002
    Inventors: Andrew Brookfield Swaine, Conrado Blasco Allue, Ian Victor Devereux, David James Williamson, Anthony Neil Berent
  • Publication number: 20020124216
    Abstract: The present invention provides a technique for operating an integrated circuit comprising a plurality of circuit elements, with a plurality of serial test scan chains, each being coupled to a different one of the circuit elements. A scan chain selector is responsive to a specified scan chain specifying value to select a corresponding one of the plurality of test scan chains. A scan chain controller is also provided which has a serial interface for receiving signals from outside of the integrated circuit, the scan chain controller comprising an instruction decoder for decoding scan chain controller instructions received from the serial interface. In accordance with the present invention, the decoder is responsive to a first scan chain controller instruction to specify a pre-determined scan chain specifying value and a second scan chain controller instruction for decoding by the decoder.
    Type: Application
    Filed: December 22, 2000
    Publication date: September 5, 2002
    Inventors: Conrado Blasco Allue, Ian Victor Devereux