Patents by Inventor Constance Y. Chu

Constance Y. Chu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Statistical in-process quality control sampling based on product stability through a systematic operation system and method
    Patent number: 6477432
    Abstract: A system for managing quality control in a manufacturing plant for processing lots of work in process (WIP) for at least one product, comprises a manufacturing process which includes a manufacturing executive system (MES) which provides inspection data to a statistical process control (SPC) database, and an SPC analyzer for analyzing the inspection data and providing a sampling rate rule output to a sampling rate database. A server supplies the sampling rate rule to the MES. The MES tests a condition as to whether a lot of WIP should be sampled. If the condition is met, then provide an inspect control signal for inspection to the plant for inspecting the lot. If the condition is not met, then branch away from the control signal to provide an alternative control signal to pass on to the next process step in the plant.
    Type: Grant
    Filed: January 11, 2000
    Date of Patent: November 5, 2002
    Assignee: Taiwan Semiconductor Manufacturing Company
    Inventors: Shun-An Chen, Tzu-Jeng Hsu, Ying-Wei Hsu, Constance Y. Chu