Patents by Inventor Constantine P. Vlahacos

Constantine P. Vlahacos has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Quantitative imaging of dielectric permittivity and tunability
    Patent number: 6809533
    Abstract: A near-field scanning microwave microscope images the permittivity and dielectric tunability of bulk and thin film dielectric samples on a length scale of about 1 micron or less. The microscope is sensitive to the linear permittivity, as well as to non-linear dielectric terms, which can be measured as a function of an applied electric field. A versatile finite element model is used for the system, which allows quantitive results to e obtained. The technique is non-destructive and has broadband (0.1-50 GHz) capability.
    Type: Grant
    Filed: March 1, 2002
    Date of Patent: October 26, 2004
    Assignee: University of Maryland, College Park
    Inventors: Steven Mark Anlage, David E. Steinhauer, Constantine P. Vlahacos, Frederick C. Wellstood