Abstract: Embodiments of the present invention provide systems and methods for multidimensional parts average testing for testing devices and analyzing testing results to detect outliers according to embodiments of the present invention. The testing can include calculating multivariate (e.g., bivariate) statistics using delta measurements of like devices, a ratio of measurements, or principal component analysis that identifies eigenvectors and eigenvalues to define meta parameters, for example. Raw test result data can be converted to residual space and robust regression can be performed to prevent outlier results from influencing regression, thereby reducing overkill advantageously.