Abstract: In a method and system for testing an intermediary device, a tester provides a test signal to a device under test (DUT) via a first circuit path on the intermediary device. A first response is received from the DUT to verify that the DUT and the first circuit path are substantially free from defects. The DUT is configured to include a second circuit path to be tested. The test signal is provided by the DUT to the second circuit path. A second response is received from the DUT to verify that the second circuit path is substantially free from defects. In a similar manner, the DUT is configured to include additional components of the intermediary device to be tested.