Abstract: A path-based crosstalk fault model is used in conjunction with a built-in self-test (BIST) and software capability for automatic test pattern generation. The solution allows for test patterns to be generated that maximize switching activity as well as inductive and capacitive crosstalk. The path based fault model targets the accumulative effect of crosstalk along a particular net (“victim” path), as compared with the discrete nets used in conventional fault models. The BIST solution allows for full controllability of the target paths and any associated aggressors. The BIST combined with automatic test pattern generation software enables defect detection and silicon validation of delay defects on long parallel nets.

Abstract: A path-based crosstalk fault model is used in conjunction with a built-in self-test (BIST) and software capability for automatic test pattern generation. The solution allows for test patterns to be generated that maximize switching activity as well as inductive and capacitive crosstalk. The path based fault model targets the accumulative effect of crosstalk along a particular net (“victim” path), as compared with the discrete nets used in conventional fault models. The BIST solution allows for full controllability of the target paths and any associated aggressors. The BIST combined with automatic test pattern generation software enables defect detection and silicon validation of delay defects on long parallel nets.