Patents by Inventor Corey L. Bungay

Corey L. Bungay has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Reduction of reflections through relatively angled transmissive surfaces and gradient-index layer
    Patent number: 11525944
    Abstract: Disclosed are optical systems that vary the refractive index of at least one relatively angled transmissive surface to reduce reflections. Embodiments include at least one optical component with relatively angled surface portions that are transmissive to electromagnetic radiation (EMR). In certain embodiments, an electrically conductive layer reflective to EMR and an anti-reflective coating are proximate the optical component. The anti-reflective coating includes a gradient-index (GRIN) layer with an index of refraction that varies across a length to increase propagation of EMR at a predetermined angle of incidence to prevent reflection of the EMR between the angled transmissive surfaces.
    Type: Grant
    Filed: November 18, 2019
    Date of Patent: December 13, 2022
    Assignee: Lockheed Martin Corporation
    Inventors: Christopher B. Fleagle, Clara R. Baleine, Corey L. Bungay, Erwan A. P. Baleine
  • Customizing the refractive index of a surface
    Patent number: 10983255
    Abstract: Mechanisms for customizing a refractive index of an optical component are disclosed. In one example, sub-wavelength openings are formed in a top layer of anti-reflective (AR) material of an optical component to tailor transmission characteristics of the AR material over a range of angles of incidence and a range of wavelengths. In another example, sub-wavelength openings are formed at different filling fractions in the surface of the optical component.
    Type: Grant
    Filed: December 8, 2016
    Date of Patent: April 20, 2021
    Assignees: Lockheed Martin Corporation, The Penn State Research Foundation
    Inventors: Clara R. Baleine, Corey L. Bungay, Theresa S. Mayer, Andrew Swisher, Jeffrey L. Ruckman, Stephen R. Tuenge
  • Customizing the refractive index of a surface using two dimensional pattern of subwavelength openings
    Patent number: 10983254
    Abstract: Mechanisms for customizing a refractive index of an optical component are disclosed. In one example, sub-wavelength openings are formed in a top layer of anti-reflective (AR) material of an optical component to tailor transmission characteristics of the AR material over a range of angles of incidence and a range of wavelengths. In another example, sub-wavelength openings are formed at different filling fractions in the surface of the optical component.
    Type: Grant
    Filed: December 8, 2016
    Date of Patent: April 20, 2021
    Assignees: Lockheed Martin Corporation, The Penn State Research Foundation
    Inventors: Clara R. Baleine, Corey L. Bungay, Theresa S. Mayer, Andrew Swisher, Jeffrey L. Ruckman, Stephen R. Tuenge
  • Sample masking in ellipsometer and the like systems including detection of substrate backside reflections
    Patent number: 7477388
    Abstract: A system and method of preventing substrate backside reflected components in a beam of electromagnetic radiation caused to reflect from the surface of a sample in an ellipsometer or polarimeter system, involving placing a mask adjacent to the surface of the sample which allows electromagnetic radiation to access the sample over only a limited area, wherein the mask can include detector elements for collecting electromagnetic radiation reflected from the sample backside.
    Type: Grant
    Filed: May 24, 2006
    Date of Patent: January 13, 2009
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Martin M. Liphardt, James D. Welch, Corey L. Bungay, John A. Woollam
  • Sample analysis methodology utilizing electromagnetic radiation
    Patent number: 7385697
    Abstract: Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.
    Type: Grant
    Filed: May 20, 2004
    Date of Patent: June 10, 2008
    Assignee: J.A. Woollam Co., Inc.
    Inventors: John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki, Gregory K. Pribil, Craig M. Herzinger, Blaine D. Johs, James N. Hilfiker
  • Sample analysis methodology utilizing electromagnetic radiation
    Publication number: 20040257567
    Abstract: Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.
    Type: Application
    Filed: May 20, 2004
    Publication date: December 23, 2004
    Inventors: John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki, Gregory K. Pribil, Craig M. Herzinger, Blaine D. Johs, James N. Hilfiker
  • Method for evaluating sample system anisotropic refractive indices and orientations thereof in multiple dimensions
    Patent number: 6441902
    Abstract: Disclosed is a method of evaluating sample system anisotropic refractive indices, and orientations thereof with respect to an alignment surface, in multiple dimensions. The preferred method involves a sequence of steps which allows overcoming mathematical model parameter correlation during mathematical regression parameter evaluation, even though individually, steps of the present invention method wherein anisotropic refractive indices, or differences therebetween, are evaluated, require that only a relatively simple one dimensional data set be acquired.
    Type: Grant
    Filed: December 29, 1999
    Date of Patent: August 27, 2002
    Assignee: J. A. Woollam Co. Inc.
    Inventors: James N. Hilfiker, Corey L. Bungay, Craig M. Herzinger