Abstract: A method and a device for a vehicle-related telematics service are provided, the same application protocol being utilized for the telematics service both for the air interface and for the communication in the vehicle and possibly in the service center.

Abstract: A method and a device for a vehicle-related telematics service are provided, the same application protocol being utilized for the telematics service both for the air interface and for the communication in the vehicle and possibly in the service center.

Abstract: For small angles that are near critical angle, a primary incident X-ray beam has excellent depth resolution. A series of X-ray fluorescence measurements are performed at varying small angles and analyzed for depth profiling of elements within a substrate. One highly useful application of the X-ray fluorescence measurements is depth profiling of a dopant used in semiconductor manufacturing such as arsenic, phosphorus, and boron. In one example, angles are be varied from 0.01° to 0.20° and measurements made to profile arsenic distribution within a semiconductor wafer. In one embodiment, measurements are acquired using a total reflection X-ray fluorescence (TXRF) type system for both known and unknown profile distribution samples. The fluorescence measurements are denominated in counts/second terms and formed as ratios comparing the known and unknown sample results. The count ratios are compared to ratios of known to unknown samples that are acquired using a control analytical measurement technique.