Patents by Inventor Cornelius B. J. D. Albrecht

Cornelius B. J. D. Albrecht has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4292524
    Abstract: In transversal tomography devices in which the X-ray beam and the array of detectors are such that they cover the higher slice to be examined, a very large array dynamic range (the ratio between the largest detector signal and the smallest detector signal occurring during a measurement) occurs. The array dynamic range often lies between the values 10.sup.4 and 2.10.sup.4. By adaptation of integration capacitances of the integrators connected to the detectors to the position of the detector in the array, the array dynamic range can be reduced. If the ratio between the largest integration capacitance (at the end of the row) and the smallest integration capacitance (in the center of the array) equals, for example, 40, the array dynamic range is substantially smaller than 1000. The advantage consists in that less severe requirements are imposed on the signal processing section connected to the integrators.
    Type: Grant
    Filed: October 5, 1978
    Date of Patent: September 29, 1981
    Assignee: U.S. Philips Corporation
    Inventors: Cornelius B. J. d. Albrecht, Jan J. M. Mulleneers
  • Patent number: 4225789
    Abstract: A device for computer tomography, comprising an X-ray source, a number of X-ray detectors and a signal processing network which includes a comparator for comparing detector output signals with data obtained during measurement of a calibration material and stored in a memory. The comparator determines, by way of interpolation, the thicknesses of calibration material which correspond to detector output signals and provides computer input signalswhich are a function of these thicknesses. By means of these computer input signals, an image of the density distribution of an irradiated patient is calculated. This image is free from interference patterns caused by differences between the detectors, by non-linearity of the detectors or by hardening of the radiation.
    Type: Grant
    Filed: August 30, 1978
    Date of Patent: September 30, 1980
    Assignee: U.S. Philips Corporation
    Inventor: Cornelius B. J. D. Albrecht