Abstract: The invention relates to a device for measuring a first parameter of a specimen, the device including a measuring volume configured to receive the specimen, a first control module and a measuring module, the first control module being configured to supply electricity to the measuring module with an electrical supply current, the measuring module including a magnetic field generator, a sensor and a second control module, the magnetic field generator being configured to generate a magnetic field in the measuring volume, the sensor being configured to measure values of a variable of the measuring volume during the generation of the magnetic field, the second measuring control module being configured to calculate a value of the parameter based on at least one value of the variable. The first control module is configured in order, following the generation of the magnetic field, to inhibit the power supply of the measuring module during a first predetermined length of time (dn).

Abstract: The invention relates to a device for measuring a first parameter of a specimen, the device including a measuring volume configured to receive the specimen, a first control module and a measuring module, the first control module being configured to supply electricity to the measuring module with an electrical supply current, the measuring module including a magnetic field generator, a sensor and a second control module, the magnetic field generator being configured to generate a magnetic field in the measuring volume, the sensor being configured to measure values of a variable of the measuring volume during the generation of the magnetic field, the second measuring control module being configured to calculate a value of the parameter based on at least one value of the variable. The first control module is configured in order, following the generation of the magnetic field, to inhibit the power supply of the measuring module during a first predetermined length of time (dn).