Abstract: The present invention relates to a universal contactor system for testing multiple size BGA devices on multiple types of testing equipment. The universal contactor system is comprised of a plurality of pogo pin which provide a connection between the BGA device to be tested and a DUT (Device Under Test) board. A contactor block having a plurality of apertures therethrough is used for holding the plurality of pogo pins. A guide plate having a center opening is coupled to the contactor block. The center opening in the guide plate is used for aligning the BGA device to be tested on the contactor block. The guide plate may be replaced with guide plates having a larger or smaller opening to align BGA devices of a larger or smaller size on the contactor block.

Abstract: The present invention relates to a double ended spring probe ring interface for multiple pin test heads, such as a 120 pin sentry style test head. The double ended spring probe ring is comprised of a non-conductive ring having a plurality of apertures equally spaced along an outer radius of the ring. A plurality of double-ended spring probes are held in the ring by a holding device which is coupled to each spring probe. The holding device holds the spring probe within the ring so as to maintain coplanarity among the spring probes.

Abstract: The present invention relates to a spring probe contactor for testing BGA devices. The spring probe contactor is comprised of a plurality of spring probes for providing a connection between a BGA device to be tested and a DUT board. The plurality of spring probes are held within a contactor block having a plurality of apertures therethrough. The apertures are wide enough to hold a single spring probe within the contactor block without the spring probe coming into contact with the contactor block. A retaining plate is coupled to the contactor block for holding the plurality of spring probes within the contactor block. The retaining plate has a raised portion thereon which limits the compression of the plurality of spring probes when a BGA device is placed in the spring probe contactor.

Abstract: A spring probe (pogo pin) contactor for testing PGA (Pin Grid Array) devices that limits compression of pogo pins within the spring probe contactor is disclosed. A PGA device has a plurality of device pins extending therefrom for insertion into the spring probe contactor in order to test the PGA device. At least one device pin of the plurality of device pins is provided with a widened annular portion expanding from a portion of the one device pin. A surface of the spring probe contactor has an array of apertures for receiving each device pin of the plurality of device pins of the PGA device in order to make contact with and compress the pogo pins. A cavity is coupled to the surface of the spring probe contactor which corresponds to and mates with the widened annular portion of the one device pin in order to limit an amount of insertion of the PGA device, thereby limiting the compression of the pogo pins.

Abstract: A docking handle assembly is integrally formed from a single piece of metal for providing orthoganal movement of first and second levers. The docking handle has a set of three pivot points arranged in the form of a right triangle; and the main body portion has first and second handles extending outwardly therefrom in a mutually perpendicular arrangement, with each of the handles parallel to a different leg of the right triangle forming the pivot points. In operation, the pivot point located at the right angle of the triangle is pivotally attached to a support surface. The ends of first and second levers to be moved by the docking handle are pivotally attached to the other pivot points, respectively, for push-pull movement, as the main body portion is rotated by the handles about the pivot point attached to the underlying support surface.