Patents by Inventor Craig J. Lambert

Craig J. Lambert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for synchronizing signals in a testing system
    Patent number: 8000921
    Abstract: The preferred embodiments of the present invention provide approaches for synchronizing signals in a testing system. In some embodiments, the timing signal associated with each device under test (DUT) is maintained at an integer multiple of the tester timing signal. Additionally, in other embodiments, the timing signal associated with various DUTs is used as a timing reference for other devices.
    Type: Grant
    Filed: June 23, 2009
    Date of Patent: August 16, 2011
    Assignee: Texas Instruments Incorporated
    Inventors: Dale A Heaton, Craig J Lambert, Vanessa M Bodrero, Alain C Chiari
  • Method and apparatus for synchronizing signals in a testing system
    Patent number: 7567883
    Abstract: The preferred embodiments of the present invention provide approaches for synchronizing signals in a testing system. In some embodiments, the timing signal associated with each device under test (DUT) is maintained at an integer multiple of the tester timing signal. Additionally, in other embodiments, the timing signal associated with various DUTs is used as a timing reference for other devices.
    Type: Grant
    Filed: June 13, 2007
    Date of Patent: July 28, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Dale A Heaton, Craig J Lambert, Vanessa M Bodrero, Alain C Chiari
  • Compare path bandwith control for high performance automatic test systems
    Patent number: 6617844
    Abstract: The compare path bandwidth control for high performance automatic test systems provides a standard dual comparator mode with single ended transmission lines for low frequency applications with a capability of receiving a differential signal when using the dual comparators (40), (41) as an effective single comparator for high frequency applications.
    Type: Grant
    Filed: September 23, 2002
    Date of Patent: September 9, 2003
    Assignee: Texas Instruments Incorporated
    Inventor: Craig J. Lambert
  • Compare path bandwidth control for high performance automatic test systems
    Patent number: 6597165
    Abstract: The compare path bandwidth control for high performance automatic test systems provides a standard dual comparator mode with single ended transmission lines for low frequency applications with a capability of receiving a differential signal when using the dual comparators (40), (41) as an effective single comparator for high frequency applications.
    Type: Grant
    Filed: September 23, 2002
    Date of Patent: July 22, 2003
    Assignee: Texas Instruments Incorporated
    Inventor: Craig J. Lambert
  • Compare path bandwidth control for high performance automatic test systems
    Publication number: 20030020459
    Abstract: The compare path bandwidth control for high performance automatic test systems provides a standard dual comparator mode with single ended transmission lines for low frequency applications with a capability of receiving a differential signal when using the dual comparators (40), (41) as an effective single comparator for high frequency applications.
    Type: Application
    Filed: September 23, 2002
    Publication date: January 30, 2003
    Inventor: Craig J. Lambert
  • Compare path bandwidth control for high performance automatic test systems
    Publication number: 20030020458
    Abstract: The compare path bandwidth control for high performance automatic test systems provides a standard dual comparator mode with single ended transmission lines for low frequency applications with a capability of receiving a differential signal when using the dual comparators (40), (41) as an effective single comparator for high frequency applications.
    Type: Application
    Filed: September 23, 2002
    Publication date: January 30, 2003
    Inventor: Craig J. Lambert
  • Compare path bandwidth control for high performance automatic test systems
    Patent number: 6479985
    Abstract: The compare path bandwidth control for high performance automatic test systems provides a standard dual comparator mode with single ended transmission lines for low frequency applications with a capability of receiving a differential signal when using the dual comparators (40), (41) as an effective single comparator for high frequency applications.
    Type: Grant
    Filed: June 1, 2001
    Date of Patent: November 12, 2002
    Assignee: Texas Instruments Incorporated
    Inventor: Craig J. Lambert
  • Compare path bandwidth control for high performance automatic test systems
    Publication number: 20010048317
    Abstract: The compare path bandwidth control for high performance automatic test systems provides a standard dual comparator mode with single ended transmission lines for low frequency applications with a capability of receiving a differential signal when using the dual comparators (40), (41) as an effective single comparator for high frequency applications.
    Type: Application
    Filed: June 1, 2001
    Publication date: December 6, 2001
    Inventor: Craig J. Lambert