Patents by Inventor CRAIG M. BOCASH

CRAIG M. BOCASH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10732202
    Abstract: A repairable rigid test probe system includes an annular gimbal supported by an annular gimbal bearing of a probe card assembly, a test substrate seated and aligned within the annular gimbal, a rigid die including thick periphery and a thin center containing an array of through holes that is aligned above the test substrate, and an array of rigid probes inserted into each of the array of through holes, where each rigid probe includes: a tail end that contacts a connection on a facing surface of the test substrate, a collar limiting a distance of insertion, and a tip that contacts a corresponding contact on a facing surface of a device under test.
    Type: Grant
    Filed: March 29, 2016
    Date of Patent: August 4, 2020
    Assignee: GLOBALFOUNDRIES INC.
    Inventors: Craig M. Bocash, David L. Gardell, Peter W. Neff
  • Publication number: 20170285068
    Abstract: A repairable rigid test probe system includes an annular gimbal supported by an annular gimbal bearing of a probe card assembly, a test substrate seated and aligned within the annular gimbal, a rigid die including thick periphery and a thin center containing an array of through holes that is aligned above the test substrate, and an array of rigid probes inserted into each of the array of through holes, where each rigid probe includes: a tail end that contacts a connection on a facing surface of the test substrate, a collar limiting a distance of insertion, and a tip that contacts a corresponding contact on a facing surface of a device under test.
    Type: Application
    Filed: March 29, 2016
    Publication date: October 5, 2017
    Applicant: GLOBALFOUNDRIES INC.
    Inventors: CRAIG M. BOCASH, DAVID L. GARDELL, PETER W. NEFF