Abstract: An integrated circuit, a programming mechanism and a method are provided for programming manufacturing information upon non-volatile storage devices of the integrated circuit. The storage devices may be programmed after manufacture and prior to assembling the integrated circuit within a semiconductor package. Thereafter, the packaged circuit can be tested to determine where, how and when the integrated circuit was manufactured from among possibly numerous die within a wafer and wafer lot. The storage locations which receive manufacturing indicia are addressed in an address location entirely separate from the addresses which receive data during normal operation of the integrated circuit. Accordingly, manufacturing information is accessible by the manufacturer, and the customer is preferably made unaware of the address space employing those storage locations.