Abstract: A system for testing with an automated test equipment (ATE) includes a tester having at least one test resource, a tandem handler, and a mux relay that switchably connects the test resource, via parallel connections, to either one of dual sockets at each instant of testing. The handler has first and second manipulator arms. Each arm operates as to a particular one of the respective sockets, to retrieve a next device to be tested and position the device in the socket (while testing is performed on a device in the other socket), to disposition the device from the socket once testing is completed as to the device in the socket, and thereafter repeat until all staged devices for testing have been tested (or an interruption of testing otherwise occurs). The mux relay switches between sockets in response to the tandem handler acting as a master and the tester as slave.

Abstract: A system for testing with an automated test equipment (ATE). The ATE includes a tester, an interface board connected to the tester, a first socket and a second socket of the interface board, a first manipulator arm connected to the tester, and a second manipulator arm connected to the tester. The first socket and the second socket are parallel-wired to the tester. The ATE also includes a switch connected to the tester and the interface board. The switch selectively effects communicative connection of the tester to either of the first socket or the second socket at each instant. During testing via one of the sockets, one of the manipulator arms moves post-test devices and replaces next devices for testing in the other of the sockets. After testing via one of the sockets is completed, the switch immediately connects the other socket and testing of next devices commences and continues for those devices.

Abstract: A system for testing with an automated test equipment (ATE) includes a tester having first and second manipulator arms. The tester has a pin electronics card. The pin electronics card includes a tester channel for connecting to a single pin of a device under test. The pin electronics card also includes a muxing relay connected to the tester channel, a first lead of the muxing relay, for connecting to a single pin of a first device under test, and a second lead of the muxing relay, for connecting to a single pin of a second device under test. The muxing relay electrically switches from testing of the first device under test to testing of the second device under test, and vice versa. respectively, with negligible index time.

Abstract: A system for testing with an automated test equipment (ATE). The ATE includes a tester, an interface board connected to the tester, a first socket and a second socket of the interface board, a first manipulator arm connected to the tester, and a second manipulator arm connected to the tester. The first socket and the second socket are parallel-wired to the tester. The ATE also includes a switch connected to the tester and the interface board. The switch selectively effects communicative connection of the tester to either of the first socket or the second socket at each instant. During testing via one of the sockets, one of the manipulator arms moves post-test devices and replaces next devices for testing in the other of the sockets. After testing via one of the sockets is completed, the switch immediately connects the other socket and testing of next devices commences and continues for those devices.