Patents by Inventor Crystal Faye Springer

Crystal Faye Springer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8082520
    Abstract: A method, system and article of manufacture for database management and, more particularly, for managing multiple information management tools in a data processing system. One embodiment provides a method of managing multiple information management tools in a data processing system. The method comprises displaying, on a display device, a user interface of a toolkit configured for managing the multiple information management tools, the user interface comprising a plurality of selectable operations applicable to information management tools, receiving a user selection of an operation of the plurality of selectable operations, and applying the selected operation to at least one of the information management tools.
    Type: Grant
    Filed: February 26, 2004
    Date of Patent: December 20, 2011
    Assignee: International Business Machines Corporation
    Inventors: Jeffrey Michael Davis, Randy Eugenio Oyarzabal, Crystal Faye Springer, Nathan Gary Steffenhagen
  • Patent number: 7917897
    Abstract: Embodiments of the invention are generally related to computer systems, and more specifically to the analysis of defects in computer software products. Defects uncovered during software testing may be stored in a data structure as data defects, code defects, or environment defects, along with further data describing a particular nature of the defects. The defects may be analyzed to determine a particular problem area causing the defects. If a particular class of defects is determined to be the dominant class of defects encountered during testing, an analysis path of that class of defects may be followed to determine a cause for the defects in the respective class. Therefore, corrective measures tailored to resolving the defects associated with the determined cause may be taken.
    Type: Grant
    Filed: February 16, 2007
    Date of Patent: March 29, 2011
    Assignee: International Business Machines Corporation
    Inventors: Kathryn Allyn Bassin, Brian Richard Lepel, Warren James Leslie, Susan Eileen Skrabanek, Crystal Faye Springer, Nathan Gary Steffenhagen
  • Patent number: 7757125
    Abstract: Methods, systems, and articles of manufacture for analyzing defects associated with a software development project. Descriptions of defects identified during the testing of a software product may be stored in a data structure. One or more of the defects may be identified as data defects. If data defects are determined to be the dominant class of defects in the data structure, the data defects may be analyzed to determine a cause for one or more data defects. For example, the focus areas affected by the defects, the trends over time of the defects, the particular types of the data defects, the stability of the system, etc. may be analyzed to determine a cause for the data defects. Therefore, corrective measures may be taken based on the identified cause of the one or more data defects.
    Type: Grant
    Filed: February 16, 2007
    Date of Patent: July 13, 2010
    Assignee: International Business Machines Corporation
    Inventors: Kathryn Allyn Bassin, Clyde J. Bearss, Linda Marie Clough, Susan Eileen Skrabanek, Crystal Faye Springer
  • Publication number: 20080201612
    Abstract: Methods, systems, and articles of manufacture for analyzing defects associated with a software development project. Descriptions of defects identified during the testing of a software product may be stored in a data structure. One or more of the defects may be identified as data defects. If data defects are determined to be the dominant class of defects in the data structure, the data defects may be analyzed to determine a cause for one or more data defects. For example, the focus areas affected by the defects, the trends over time of the defects, the particular types of the data defects, the stability of the system, etc. may be analyzed to determine a cause for the data defects. Therefore, corrective measures may be taken based on the identified cause of the one or more data defects.
    Type: Application
    Filed: February 16, 2007
    Publication date: August 21, 2008
    Inventors: Kathryn Allyn Bassin, Clyde J. Bearss, Linda Marie Clough, Susan Eileen Skrabanek, Crystal Faye Springer
  • Publication number: 20080201611
    Abstract: Embodiments of the invention are generally related to computer systems, and more specifically to the analysis of defects in computer software products. Defects uncovered during software testing may be stored in a data structure as data defects, code defects, or environment defects, along with further data describing a particular nature of the defects. The defects may be analyzed to determine a particular problem area causing the defects. If a particular class of defects is determined to be the dominant class of defects encountered during testing, an analysis path of that class of defects may be followed to determine a cause for the defects in the respective class. Therefore, corrective measures tailored to resolving the defects associated with the determined cause may be taken.
    Type: Application
    Filed: February 16, 2007
    Publication date: August 21, 2008
    Inventors: Kathryn Allyn Bassin, Brian Richard Lepel, Warren James Leslie, Susan Eileen Skrabanek, Crystal Faye Springer, Nathan Gary Steffenhagen
  • Patent number: 7305653
    Abstract: Methods, systems and articles of manufacture are provided for organizing, managing and utilizing standard development templates and framework components in an application development environment. Functionality provided by embodiments of the present invention allows developers to develop applications more efficiently and cost effectively.
    Type: Grant
    Filed: March 11, 2004
    Date of Patent: December 4, 2007
    Assignee: International Business Machines Corporation
    Inventors: Jeffrey Michael Davis, Robert A. Hoth, Brian Richard Lepel, Randy Eugenio Oyarzabal, Crystal Faye Springer, James Allen Walters