Patents by Inventor Cui Hailong

Cui Hailong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test method
    Patent number: 7852982
    Abstract: To provide a method and device for testing the size and conductivity of a foreign material adhered to a substrate for a liquid crystal display device, there is provided a method of testing whether a foreign material including a metal element is adhered to a substrate for a liquid crystal display device, the method including a first test step of detecting the size and position of the foreign material adhered to the substrate and a second test step of testing whether the foreign material includes the metal element at the position detected in the first test step.
    Type: Grant
    Filed: November 24, 2009
    Date of Patent: December 14, 2010
    Assignee: Toppan Printing Co., Ltd.
    Inventors: Junichi Saito, Cui Hailong