Abstract: An X-ray analysis system is provided with multi-source design and an X-ray analysis method is provided with multi-source design. According to the embodiments, the X-ray analysis system includes a ray source including a plurality of ray generating devices that generate a ray; a detector that detects a signal generated due to an analyzed object being irradiated by the ray from the ray source; and a controller that controls the ray source, so that two or more ray generating devices in the ray source simultaneously generate corresponding rays to irradiate the analyzed object.

Abstract: Disclosed is a combined X-ray fluorescence (XRF) analysis device. According to embodiments, the combined X-ray fluorescence analysis device includes: a ray emission channel including a ray source; an energy dispersive XRF (EDXRF) detection channel including an EDXRF detector, and the EDXRF detector is configured to detect fluorescence at different energies within a certain energy range in fluorescence emitted by an object irradiated by a ray from the ray emission channel; and a wavelength dispersive XRF (WDXRF) detection channel including a WDXRF detector, and the WDXRF detector is configured to detect fluorescence at one or more specific wavelengths in the fluorescence emitted by the object irradiated by the ray from the ray emission channel.

Abstract: An X-ray analysis system is provided with multi-source design and an X-ray analysis method is provided with multi-source design. According to the embodiments, the X-ray analysis system includes a ray source including a plurality of ray generating devices that generate a ray; a detector that detects a signal generated due to an analyzed object being irradiated by the ray from the ray source; and a controller that controls the ray source, so that two or more ray generating devices in the ray source simultaneously generate corresponding rays to irradiate the analyzed object.