Patents by Inventor Cunshan Wang

Cunshan Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10254231
    Abstract: A microstructure detector and in-situ method for real-time determination of the microstructure of a material undergoing alloying or other phase transformation. The method carried out by the detector includes the steps of: (a) detecting light emitted from a plasma plume created during phase transformation of a material; (b) determining at least some of the spectral content of the detected light; and (c) determining an expected microstructure of the transformed material from the determined spectral content. Closed loop control of the phase transformation process can be carried out using feedback from the detector to achieve a desired microstructure.
    Type: Grant
    Filed: May 9, 2017
    Date of Patent: April 9, 2019
    Assignee: The Regents of the University of Michigan
    Inventors: Jyotirmoy Mazumder, Lijun Song, Cunshan Wang
  • Publication number: 20180340892
    Abstract: A microstructure detector and in-situ method for real-time determination of the microstructure of a material undergoing alloying or other phase transformation. The method carried out by the detector includes the steps of: (a) detecting light emitted from a plasma plume created during phase transformation of a material; (b) determining at least some of the spectral content of the detected light; and (c) determining an expected microstructure of the transformed material from the determined spectral content. Closed loop control of the phase transformation process can be carried out using feedback from the detector to achieve a desired microstructure.
    Type: Application
    Filed: May 9, 2017
    Publication date: November 29, 2018
    Inventors: Jyotirmoy Mazumder, Lijun Song, Cunshan Wang
  • Patent number: 9752988
    Abstract: A microstructure detector and in-situ method for real-time determination of the microstructure of a material undergoing alloying or other phase transformation. The method carried out by the detector includes the steps of: (a) detecting light emitted from a plasma plume created during phase transformation of a material; (b) determining at least some of the spectral content of the detected light; and (c) determining an expected microstructure of the transformed material from the determined spectral content. Closed loop control of the phase transformation process can be carried out using feedback from the detector to achieve a desired microstructure.
    Type: Grant
    Filed: June 14, 2011
    Date of Patent: September 5, 2017
    Assignee: The Regents of the University of Michigan
    Inventors: Jyotirmoy Mazumder, Lijun Song, Cunshan Wang
  • Publication number: 20120177810
    Abstract: A microstructure detector and in-situ method for real-time determination of the microstructure of a material undergoing alloying or other phase transformation. The method carried out by the detector includes the steps of: (a) detecting light emitted from a plasma plume created during phase transformation of a material; (b) determining at least some of the spectral content of the detected light; and (c) determining an expected microstructure of the transformed material from the determined spectral content. Closed loop control of the phase transformation process can be carried out using feedback from the detector to achieve a desired microstructure.
    Type: Application
    Filed: June 14, 2011
    Publication date: July 12, 2012
    Applicant: THE REGENTS OF THE UNIVERSITY OF MICHIGAN
    Inventors: Jyotirmoy Mazumder, Lijun Song, Cunshan Wang