Patents by Inventor Curito M. Bilan, Jr.

Curito M. Bilan, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for testing semiconductor devices
    Patent number: 6709877
    Abstract: There is disclosed an apparatus for supporting singulated electronic devices during a testing operation, comprising: a main body and a support member, wherein said support member is made of non-conducting high-resistivity material and comprises a plurality of recesses, each said recess being adapted to receive an individual singulated device. There is also disclosed a method for testing such devices in which the devices are carried on support members through a testing process including one or more environmental control chambers.
    Type: Grant
    Filed: July 23, 2001
    Date of Patent: March 23, 2004
    Assignee: ASM Assembly Automation Limited
    Inventors: Ching Man Stanley Tsui, Eric Chow, Curito M. Bilan, Jr.